Investigation of ferromagnetic/antiferromagnetic nanostructures using X-ray magnetic dichroism

ORAL

Abstract

The spin structure of epitaxially grown antiferromagnetic/ferromagnetic bilayer was investigated using X-ray Magnetic Circular Dichroism (XMCD) and X-ray Magnetic Linear Dichroism (XMLD) techniques. The XMLD measurement on the antiferomagnetic film (NiO or CoO) gives a direct probe of the spin orientation of the compensated antiferromagnetic spins. This capability enables us to give a clear clue to the mechanism of the exchange bias in the bilayer and to give a direct observation of the antiferromagnetic vortex.

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Authors

  • J. Wu

    • National High Magnetic Field Laboratory, Florida State University, Tallahassee, Florida 32310, USA

  • J.S. Park

    • Department of Physics, University of California at Berkeley, Berkeley, California 94720, USA

  • W. Kim

    • Korea Research Institute of Standards and Science, Yuseong, Daejeon 305-340, Koera

  • E. Arenholz

    • Advanced Light Source, Lawrence Berkeley National Laboratory, Berkeley, California 94720, USA

  • M. Liberati

    • Advanced Light Source, Lawrence Berkeley National Laboratory, Berkeley, California 94720, USA

  • A. Scholl

    • Advanced Light Source, Lawrence Berkeley National Laboratory, Berkeley, California 94720, USA

  • Chanyong Hwang

    • Korea Research Institute of Standards and Science, Yuseong, Daejeon 305-340, Koera

  • Z.Q. Qiu

    • Department of Physics, University of California at Berkeley, Berkeley, California 94720, USA