Real time electron counting through wavelet edge detection
ORAL
Abstract
We have recently demonstrated single-shot measurements of individual electron spins in a Si/SiGe quantum dot. These experiments were analyzed using a wavelet-based technique that allows detection of charging events in real time. An alternative method, based on level thresholding, is not well suited for real time detection, due to drifting background currents in the charge sensor. In contrast, the wavelet technique relies on edge detection and is hence robust against drifting currents levels. In this talk, we describe our wavelet algorithm and its applications for charge sensing. We benchmark the performance of the algorithm under realistic signal noise conditions.
*This work was supported by ARO, LPS, NSF and DARPA.
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Authors
Bjorn Van Bael
University of Wisconsin-Madison
J.R. Prance
University of Wisconsin-Madison
C.B. Simmons
University of Wisconsin-Madison
Teck Seng Koh
University of Wisconsin-Madison
Zhan Shi
University of Wisconsin-Madison
D.E. Savage
Material Science Center, University of Wisconsin
University of Wisconsin-Madison
Max Lagally
University of Wisconsin-Madison
University of Wisconsin Madison
R. Joynt
University of Wisconsin-Madison
Mark Friesen
University of Wisconsin- Madison
University of Wisconsin-Madison
Department of Physics, Unviersity of Wisconsin-Madison, Madison WI 53706
