Microscopic Memory in Co/Pd Multilayer Films

ORAL

Abstract

We report measurements of microscopic memory between speckle patterns of CoPd films exhibiting perpendicular magnetic anisotropy. The speckle patterns were formed by coherent x-ray resonant scattering in a transmission geometry. Return point memory and conjugate point memory were determined as function of applied field. On the length scale probed, the results indicate that the measured memory is a statistical distribution itself, and not a fixed quantity. Memory as a function a scattered wave vector factor was also investigated.

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Authors

  • Run Su

    • Physics Department, University of Oregon

  • Keoki Seu

    • Physics Department, University of Oregon

  • Sujoy Roy

    • Advanced Light Source, Lawrence Berkeley National Laboratory, Berkeley

  • Daniel Parks

    • Physics Department, University of Oregon

  • Erik Shipton

    • Electrical and Computer Engineering, University of California, San Diego

  • Eric Fullerton

    • Electrical and Computer Engineering, University of California, San Diego

  • Steve Kevan

    • Physics Department, University of Oregon