Switching transition between bi-stable memory switching and mono-stable threshold switching based on ion migration in a NiO thin film
POSTER
Abstract
We have investigated a transition of resistive switching behaviors between bi-stable memory switching and mono-stable threshold switching in a NiO film, which was controllable by the polarity and width of applied electric pulse. Macroscopic model was proposed to explain the polarity- and width-dependence of electrical transition that provided experimental evidences for migration of oxygen ions (O2-) to be responsible for the filamentary resistive switching mechanism