Dynamical Decoupling with Imperfect Pulses in P Doped Silicon

ORAL

Abstract

Dynamical decoupling (DD) is an important tool for prolonging coherence in solid-state spin systems. For advanced DD protocols comprising many pulses, the accumulation of pulse errors may become devastating. We studied DD of the electron spins of P donors in silicon with pulsed ESR [1]. Two-axis periodic pulse sequences, and their concatenated and symmetrized versions, have been investigated experimentally and theoretically. The impact of pulse errors has been analyzed for different initial states of the P spins. Depending on the sequence, some spin components decay after only 3 periods (12 pulses), while other components exhibit artificial freezing [2] at long times. We give a theoretical description for these effects, showing that their origin is the accumulation of pulse errors. We identify promising sequences where the impact of errors is minimized. [1] A. M. Tyryshkin et al., J. Phys. Cond. Mat. 18, S783 (2006) [2] W. Zhang et al., Phys. Rev. B 77, 125336 (2008)

*The work is funded by DOE and LPS.

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Authors

  • Z. Wang

    • Ames Laboratory, Ames, IA, 50011, USA

  • W. Zhang

    • Fudan University, Shanghai, 200433, China

  • V. V. Dobrovitski

    • Ames Laboratory, Ames, IA, 50011, USA

  • A. M. Tyryshkin

    • Princeton University, Princeton, NJ, 08544, USA

  • S. A. Lyon

    • Princeton University, Princeton, NJ, 08544, USA

  • J. Ager

    • LBNL, Berkeley, CA, 94720, USA