A Direct Determination of the Structure of Polar SrTiO3 on Silicon

ORAL

Abstract

The epitaxial growth of perovskite oxide structures on silicon substrates has opened the door for the integration of a wide range of novel physical properties unique to complex oxides with established silicon-based technologies. A model system is the polar SrTiO3/Si system. Synchrotron based x-ray diffraction measurements allow a direct determination of the structure of the SrTiO3-Si interface, as well as the atomic displacements in the SrTiO3 film. A combination of direct phasing methods and fitting algorithms is used to convert the diffraction data into sub-angstrom resolution real space structural maps. The results can be used to understand the polarization observed in the SrTiO3 thin films and the measured differences between 2.5 and 5 unit cell SrTiO3 deposited on Si.

–

Authors

  • Divine Kumah

    • Center for Research on Interface Structure and Phenomena and Department of Applied Physics, Yale University, New Haven, CT

  • James Reiner

    • Yale University
    • Center for Research on Interface Structure and Phenomena and Department of Applied Physics, Yale University, New Haven, CT

  • Yaron Segal

    • Center for Research on Interface Structure and Phenomena and Department of Applied Physics, Yale University, New Haven, CT

  • Zhan Zhang

    • Advanced Photon Source, Argonne National Laboratory, Argonne, IL

  • Alexie Kolpak

    • Center for Research on Interface Structure and Phenomena and Department of Applied Physics, Yale University, New Haven, CT

  • Sohrab Ismail-Beigi

    • Department of Physics and Applied Physics, Yale University
    • Yale University
    • Center for Research on Interface Structure and Phenomena and Department of Applied Physics, Yale University, New Haven, CT
    • Center for Research on Interface Structures and Phenomena, Yale University
    • Department of Applied Physics, Yale University

  • Charles Ahn

    • Center for Research on Interface Structure and Phenomena and Department of Applied Physics, Yale University, New Haven, CT

  • Fred Walker

    • CRISP, Yale University
    • Yale University
    • Applied Physics and Center for Research on Interface Structure and Phenomena, Yale University
    • Center for Research on Interface Structure and Phenomena and Department of Applied Physics, Yale University, New Haven, CT