Ab initio study of hot carrier lifetime in graphene and bilayer graphene
ORAL
Abstract
The lifetime of charge carriers through inelastic scattering processes determines transport properties of electronic devices operating at a high source-drain bias voltage at which the inelastic carrier mean free path is much shorter than the elastic one. Therefore, knowing the carrier lifetime arising from inelastic scattering processes is an important step towards the electronic device applications. We present a first-principles calculation of the carrier lifetime in graphene and bilayer graphene considering both electron-electron and electron-phonon interactions. We also compare our calculated results with recent ultrafast pump-probe optical and angle-resolved photoemission spectroscopy measurements on graphene. The results from these two kinds of experiments appear to contradict with each other.
*This work was supported by the NSF under Grant No. DMR07-05941, and the U.S. DOE under Contract No. DE-AC02-05CH11231. Computer time was provided by NERSC and NPACI.
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Authors
Cheol-Hwan Park
UC Berkeley
Department of Physics, University of California, Berkeley and Materials Sciences Division, Lawrence Berkeley National Laboratory
UC Berkeley and Lawrence Berkeley National Lab
Feliciano Giustino
University of Oxford
Catalin D. Spataru
Sandia National Laboratories
Marvin L. Cohen
UC Berkeley and Lawrence Berkeley National Laboratory
Department of Physics, University of California, Berkeley. Materials Science Division, Lawrence Berkeley National Laboratory, Berkeley, California
UC Berkeley
Department of Physics, University of California, Berkeley and Materials Sciences Division, Lawrence Berkeley National Laboratory
Department of Physics, University of California, Berkeley; Material Science Division, Lawrence Berkeley National Laboratory
Deptartment of Physics, University of California, Berkeley; Materials Science Division, Lawrence Berkeley National Laboratory
Department of Physics, University of California, Berkeley, and Materials Science Division, Lawrence Berkeley National Laboratory
Department of Physics, University of California at Berkeley and Materials Sciences Division, Lawrence Berkeley National Laboratory, Berkeley, CA 94720
Steven G. Louie
UC Berkeley and Lawrence Berkeley National Laboratory
Department of Physics, University of California, Berkeley. Materials Science Division, Lawrence Berkeley National Laboratory, Berkeley, California
University of California at Berkeley and Lawrence Berkeley National Lab
University of California at Berkeley and Lawrence Berkeley National Laboratory
University of California, Berkeley and Lawrence Berkeley National Laboratory
UC Berkeley
Department of Physics, University of California, Berkeley and Materials Sciences Division, Lawrence Berkeley National Laboratory
UC Berkeley and Lawrence Berkeley National Lab
UC Berkeley and LBNL
Department of Physics, University of California, Berkeley, and Materials Science Division, Lawrence Berkeley National Laboratory
Dept. of Physics, University of California Berkeley and The Molecular Foundry, LBNL
Department of Physics, University of California at Berkeley and Materials Sciences Division, Lawrence Berkeley National Laboratory, Berkeley, CA 94720