Modeling single-electron resonances of electric-field-sensitive scanning probes

ORAL

Abstract

Electric-field sensitive scanning probe methods have proven to be valuable tools to study nanoelectronics systems. We have developed a modeling method suitable to analyze single-electron resonances detected by these techniques. The method is based on basic electrostatics and a numerical boundary-element approach. The results compare well with experimental single-electron capacitance-voltage curves and capacitance images.

*This work was supported by the NSF under grant nos. DMR-0305461, DMR-0906939 and the Michigan State Institute for Quantum Sciences.

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Authors

  • Stuart Tessmer

    • Michigan State University

  • Irma Kuljanishvili

    • Department of Physics \& Astronomy, Northwestern University
    • Northwestern University

  • Morewell Gasseller

    • Michigan State University