High-resolution O(N) DFT method and its application to large-scale nanowire simulations
ORAL
Abstract
Using a real-space finite difference discretization and orbitals localization techniques, accurate O(N) Density Functional Theory calculations of systems made of thousands of atoms are now possible [1]. Using that methodology, we have investigated the static dielectric properties of silicon nanorods for diameters as large as 5 nm. We used a finite electric field method with non-periodic boundary conditions to calculate the dielectric response of the system, extending a previous study [2] to larger nanowires. \\[4pt] [1] J.-L. Fattebert and F. Gygi, Phys. Rev. B 73, 115124 (2006)\\[0pt] [2] S. Hamel et al., Appl. Phys. Lett. 92, 043115 (2008)
*This research is supported by the Office of Science, U.S. Department of Energy, SciDAC Grant DE-FC02-06ER46262. Prepared by LLNL under Contract DE-AC52-07NA27344.
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