Si/SiGe Quantum Dot with SET Charge Sensor
ORAL
Abstract
Si/SiGe quantum dots promise a long spin coherence time due to reduced electron-nuclear spin interaction. Based on robust fabrication process we have developed, reliable ohmic contacts and non-leaky Schottky gates are repeatedly produced. As a result, stable quantum dots have been successfully formed, with sufficiently high yield to allow subsequent fabrication steps. Representative Coulomb blockade data will be shown. Efforts to couple a single electron transistor (SET) to a Si/SiGe dot in order to monitor its charge state are in progress. Recent experimental results will be discussed.
*This research was supported by the NSA, LPS and ARO under Agreement No. W911NF-08-1-0482
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