Focus Session: Dopants and Defects in Semiconductors - Nitrides, SiC
FOCUS · D25 ·
Presentations
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Electrical properties of point and extended defects in indium nitride
COFFEE_KLATCH · Invited
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Authors
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Joel W. Ager III
- Materials Sciences Division - Berkeley National Lab
- Lawrence Berkeley National Laboratory
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Optical Properties of GaN/ZnO solid solutions studied by Density Functional Calculations
ORAL
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Authors
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Li Li
- State University of New York at Stony Brook
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P. B. Allen
- State University of New York at Stony Brook
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ABSTRACT WITHDRAWN
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Theory of hot-carrier-induced phenomena in GaN high-electron-mobility transistors
ORAL
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Authors
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Yevgeniy Puzyrev
- Vanderbilt University
- Department of Physics and Astronomy, Vanderbilt University
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Blair Tuttle
- Penn State Behrend
- Department of Physics, Penn State Behrend College
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Ronald Schrimpf
- Vanderbilt University
- Department of Electrical Engineering and Computer Science, Vanderbilt University
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Daniel Fleetwood
- Vanderbilt University
- Department of Electrical Engineering and Computer Science, Vanderbilt University
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Sokrates Pantelides
- Department of Physics and Astronomy, Vanderbilt University, Nashville, Tennessee 37235
- Vanderbilt University, Oak Ridge National Laboratory
- Vanderbilt Univ.
- Department of Physics and Astronomy, Vanderbilt University
- Vanderbilt University
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Stress-assisted migration of vacancies in GaN HEMTs
ORAL
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Authors
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Keith Warnick
- Vanderbilt University
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Yevgeniy Puzyrev
- Vanderbilt University
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Sokrates Pantelides
- Vanderbilt University
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Mg-related EPR signal in high hole density GaN
ORAL
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Authors
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Mary Ellen Zvanut
- University of Alabama at Birmingham
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Jamiyana Dashdorj
- University of Alabama at Birmingham
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Gate Bias Dependent Two Layer Conduction in InAlN/AlN/GaN Heterostructures
ORAL
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Authors
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Hailing Cheng
- University of Michigan
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Cagliyan Kurdak
- Physcis, University of Michigan
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Jacob Leach
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Xianfeng Ni
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Xing Li
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Mo Wu
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Umit Ozgur
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Hadis Morkoc
- ECE, Virginia Commonwealth University
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Lin Zhou
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David Smith
- Physics, Arisona State University
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Igor Vurgaftman
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Jerry Meyer
- Naval Research Laboratory
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Structure and defects at the SiC:SiO$_{2}$ interface
ORAL
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Authors
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Blair Tuttle
- Penn State Behrend
- Department of Physics, Penn State Behrend College
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Sokrates Pantelides
- Vanderbilt University
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Carbon-Rich Silicon Carbide
ORAL
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Authors
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Xiao Shen
- Vanderbilt University
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Yevgeniy Puzyrev
- Vanderbilt University
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Gerd Duscher
- University of Tennessee-Knoxville
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Sokrates Pantelides
- Vanderbilt University
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Carbon defects at the SiC-SiO$_{2}$ interface and the effects of hydrogen and fluorine
ORAL
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Authors
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Yingdi Liu
- The University of Tulsa
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Michael Halfmoon
- The University of Tulsa
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Sanwu Wang
- The University of Tulsa
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Strong hot electron reflection from subsurface 8H-SiC inclusion in 4H-SiC: Ballistic Electron Emission Microscopy (BEEM) study
ORAL
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Authors
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K.-B. Park
- Ulsan National Institute of Science and Technology, Korea
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W. Cai
- The Ohio State University
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J.P. Pelz
- The Ohio State Univ.
- The Ohio State University
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M.S. Miao
- Case Western Reserve University
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W.R.L. Lambrecht
- Case Western Reserve University
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X. Zhang
- Carnegie Mellon University
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M. Skowronski
- Carnegie Mellon University
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M.A. Capano
- Purdue University
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First principles study of p-type conductivity in wide band gap Cu$_3$TaQ$_4$ (Q=S,Se,Te) semiconductors
ORAL
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Authors
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F.L. Barras
- Oregon State University
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Andriy Zakutayev
- Department of Physics, Oregon State University
- Oregon State University
- Department of Physics, Oregon State University, USA
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Guenter Schneider
- Oregon State University
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Origin of p-type conductivity in wide band gap BaCuQF (Q=S,Se,Te) semiconductors
ORAL
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Authors
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Guenter Schneider
- Oregon State University
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Andriy Zakutayev
- Department of Physics, Oregon State University
- Oregon State University
- Department of Physics, Oregon State University, USA
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