Probing Localization in Scattering Systems via Fidelity

POSTER

Abstract

Using scattering measurements from a microwave cavity filled with randomly distributed scatterers, we evaluate the scattering fidelity. We show that depending on the degree of localization inside the sample, the fidelity decay deviates from ``traditional'' Gaussian law, applied in the case of diffusive/chaotic cavities when small perturbations are involved. We instead show that for small displacements of one of the walls of the cavity, the fidelity decays in a novel way that reflects the degree of localization (or randomness) inside the cavity. The outcome of the experimental measurements are explained on the basis of a parametric Banded Random Matrix modeling which incoorporates localization phenomena. The theoretical results are in good agreement with those of the experiment.

Authors

  • Mei Chai Zheng

    • Dept. of Physics

  • Joshua Bodyfelt

    • Department of Physics, Wesleyan University, Middletown, Connecticut
    • Dept. of Physics, Wesleyan University

  • Ulrich Kuhl

    • Fachbereich Physik der Phillips--Universitaet Marburg

  • Hans-Juergen Stoeckmann

    • Fachbereich Physik der Phillips--Universitaet Marburg

  • Tsampikos Kottos

    • Department of Physics, Wesleyan University, Middletown CT-USA and MPI for Dynamics and Self-Organization, G\"ottingen-Germany
    • Department of Physics, Wesleyan University, Middletown, Connecticut 06459, USA and MPI for Dynamics and Self-Organization, 37073 Goettingen, Germany
    • Department of Physics, Wesleyan University, Middletown, Connecticut
    • Department of Physics, Wesleyan University, Middletown CT-USA and MPI for Dynamics and Self-Organization, Goettingen-Germany
    • Max Planck Institute for Dynamics \& Self-Organization. AND Dept. of Physics, Wesleyan University