Structural and Dielectric Properties of CoFe$_{2}$O$_{4}$-Ba$_{0.90}$La$_{0.067}$Ti$_{0.91}$Zr$_{0.09}$O$_{3}$ composite thin films.

CoFe$_{2}$O$_{4}$-Ba$_{0.90}$La$_{0.067}$Ti$_{0.91}$Zr$_{0.09}$O$_{3 }$(CFO-BLZT) composite thin films were grown via RF oxygen magnetron sputtering from a CFO-BLZT mixed target on electrically-conducting single-crystal Nb-doped SrTiO$_{3}$ (100) substrates at 1033 K. From scanning electron microscopy coupled with energy dispersive analysis of x-rays we determined that the CFO and BLZT were phase separated. X-ray photoemission spectroscopy showed that the TiO$_{6}$ octahedron in the perovskite structure was modified by the lanthanide incorporation. The dielectric characterization showed that the samples were ferroelectric at room temperature. The ferroelectric hysteresis loops measured as a function of magnetic field showed that these samples are multiferroic.