Advances in Scanned Probe Microscopy IV: Optical and High Frequency Methods

Presentations

• High-resolution element-selective microscopy using X-ray enhanced Scanning Tunneling Microscopy

  ORAL

  March 13, 2008, 10:15 AM – March 13, 2008, 10:27 AM

  Authors

  • Volker Rose

    • Argonne National Laboratory

  • J.W. Freeland

    • Argonne National Laboratory
    • Advanced Photon Source, Argonne National Laboratory, Argonne, IL 60439
    • Advanced Photon Source, Argonne National Lab.

  • K. E. Gray

    • Argonne National Laboratory

  • Stephen Streiffer

    • Argonne National Laboratory

  • Matthias Bode

    • Argonne National Laboratory

  View abstract →

• Scanning optical homodyne detection of high-frequency picoscale resonances in cantilever and tuning fork sensors

  ORAL

  March 13, 2008, 10:27 AM – March 13, 2008, 10:39 AM

  Authors

  • A. K. Gupta

    • Purdue University

  • G. Zeltzer

    • Stanford University

  • J. C. Randel

    • Stanford University

  • R. Bashir

    • Purdue University

  • S.-H. Song

    • Stanford University

  • Hari C. Manoharan

    • Stanford University
    • Department of Physics, Stanford University

  View abstract →

• Radio Frequency Scanning Tunneling Microscopy: Instrumentation and Applications

  ORAL

  March 13, 2008, 10:39 AM – March 13, 2008, 10:51 AM

  Authors

  • Utku Kemiktarak

    • Dept. of Physics, Boston University, Boston, MA 02215

  • Tchefor Ndukum

    • Department of Physics, Cornell University
    • Dept. of Physics, Cornell University, Ithaca, NY 14853

  • Keith C. Schwab

    • Department of Physics, Cornell University
    • Dept. of Physics, Cornell University, Ithaca, NY 14853

  • Kamil L. Ekinci

    • Aerospace and Mechanical Engineering, Boston University, Boston, MA
    • Dept. of Aerospace and Mechanical Eng., Boston University, Boston, MA 02215

  View abstract →

• Thermomechanical Noise Measurements of Very High Frequency (VHF) Nanomechanical Resonators

  ORAL

  March 13, 2008, 10:51 AM – March 13, 2008, 11:03 AM

  Authors

  • Carl Hart IV

    • Aerospace and Mechanical Engineering, Boston University, Boston, MA

  • Kamil L. Ekinci

    • Aerospace and Mechanical Engineering, Boston University, Boston, MA
    • Dept. of Aerospace and Mechanical Eng., Boston University, Boston, MA 02215

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• Development of an Evanescent Microwave Probe / Scanning Tunneling Microscope to study Localized Electron Spin Resonance

  ORAL

  March 13, 2008, 11:03 AM – March 13, 2008, 11:15 AM

  Authors

  • Christian Long

    • University of Maryland

  • Naoyuki Taketoshi

    • National Institute of Advanced Industrial Science and Technology

  • I. Takeuchi

    • University of Maryland
    • Univ.of Maryland

  • Haitao Yang

    • Intematix orporation

  • Xiao-Dong Xiang

    • Intematix Corporation

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• High Frequency Piezoresponse Force Microscopy in the 1-10 MHz Regime

  ORAL

  March 13, 2008, 11:15 AM – March 13, 2008, 11:27 AM

  Authors

  • Katyayani Seal

    • Oak Ridge National Laboratory

  • Stephen Jesse

    • Oak Ridge National Laboratory
    • Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, 37831

  • Brian Rodriguez

    • Oak Ridge National Laboratory

  • Arthur Baddorf

    • Oak Ridge National Laboratory
    • Center for Nanophase Materials Sciences, Oak Ridge National Laboratory
    • Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN, 37831

  • S. V. Kalinin

    • Oak Ridge National Laboratory
    • Center for Nanophase Materials Sciences, Oak Ridge National Laboratory

  View abstract →

• Contrast sensitive imaging with a cantilever-based near-field microwave probe

  ORAL

  March 13, 2008, 11:27 AM – March 13, 2008, 11:39 AM

  Authors

  • Keji Lai

    • Geballe Laboratory for Advanced Materials, Stanford University

  • Worasom Kundhikanjana

    • Geballe Laboratory for Advanced Materials, Stanford University

  • Michael Kelly

    • Geballe Laboratory for Advanced Materials, Stanford University

  • Z.-X. Shen

    • Stanford University
    • Geballe Laboratory for Advanced Materials, Stanford University
    • SSRL, Stanford

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• STM and SNOM Type of Scanning Probe Microscopes in the Same Unit: Towards Electrical Modification and Optical Characterization at Nanoscale

  ORAL

  March 13, 2008, 11:39 AM – March 13, 2008, 11:51 AM

  Authors

  • Ilya Sychugov

    • NTT Basic Research Laboratories

  • Hiroo Omi

  • Tooru Murashita

  • Yoshihiro Kobayashi

  View abstract →

• A Unique Probe for Tip Enhanced Raman Scattering and Shadow NSOM

  ORAL

  March 13, 2008, 11:51 AM – March 13, 2008, 12:03 PM

  Authors

  • Aaron Lewis

    • Hebrew University of Jerusalem

  • Hesham Taha

    • Nanonics Imaging Ltd.

  • Rimma Dekhter

    • Nanonics Imaging Ltd.

  • Galia Zinoviev

    • Nanonics Imaging Ltd.

  • Galina Fish

    • Nanonics Imaging Ltd.

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• Chemical Imaging of the Surface of Polymeric Nanostructures Using Apertureless Near-Field IR Microscopy

  ORAL

  March 13, 2008, 12:03 PM – March 13, 2008, 12:15 PM

  Authors

  • Zahra Fakhraai

    • Department of Chemistry, University of Toronto, Toronto, ON, M5S 3H6, Canada
    • University of Waterloo

  • Kerstin Mueller

    • Department of Chemistry, University of Toronto, Toronto, ON, M5S 3H6, Canada

  • Melissa Paulite

    • Department of Chemistry, University of Toronto, Toronto, ON, M5S 3H6, Canada

  • Xiujuan Yang

    • Department of Chemistry, University of Toronto, Toronto, ON, M5S 3H6, Canada

  • Gilbert Walker

    • Department of Chemistry, University of Toronto, Toronto, ON, M5S 3H6, Canada
    • Department of Chemistry, University of Toronto, Canada

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• Scanning thermal microscopy with a fluorescent nanoprobe

  ORAL

  March 13, 2008, 12:15 PM – March 13, 2008, 12:27 PM

  Authors

  • Benjamin Samson

    • LPEM / CNRS

  • Elika Saidi

    • LPEM / CNRS

  • Lionel Aigouy

    • LPEM / CNRS

  • Peter Low

    • LAAS / CNRS

  • Beomjoon Kim

    • University of Tokyo, Japan

  • Christian Bergaud

    • LAAS /CNRS

  • Michel Mortier

    • ENSCP / CNRS

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• A versatile technique for fabrication of SiC SPM probes

  ORAL

  March 13, 2008, 12:27 PM – March 13, 2008, 12:39 PM

  Authors

  • Joel Therrien

    • U. Massachusetts-Lowell

  • Daniel Schmidt

    • U. Massachusetts-Lowell

  • Sheetal Barrot

    • U. Massachusetts-Lowell

  • Bhavin Patel

    • U. Massachusetts-Lowell

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• \textit{In-situ} broadband microwave calibrations and measurements using cryogenic probe stations

  ORAL

  March 13, 2008, 12:39 PM – March 13, 2008, 12:51 PM

  Authors

  • Jeffrey Lindemuth

    • Lake Shore Cryotronics

  • Scott Yano

    • Lake Shore Cryotronics

  View abstract →