Selected Applications Using Materials Science

Presentations

• Integrated Functionality: Nanosensors

  COFFEE_KLATCH · Invited

  March 11, 2008, 7:00 AM – March 11, 2008, 7:36 AM

  Authors

  • Jozef T. Devreese

    • Universiteit Antwerpen
    • Theoretical Physics of the Solid State (TFVS), Universiteit Antwerpen, Belgium

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• ABSTRACT WITHDRAWN

  March 11, 2008, 7:36 AM – March 11, 2008, 8:12 AM

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• Nanodevice sensors measured with rf- and microwave reflectometry

  COFFEE_KLATCH · Invited

  March 11, 2008, 8:12 AM – March 11, 2008, 8:48 AM

  Authors

  • Per Delsing

    • Chalmers University of Technology, Microtechnology and Nanoscience, MC2, 412 96 Goteborg, Sweden
    • Chalmers University of Technology

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• Detection of Explosive Materials

  COFFEE_KLATCH · Invited

  March 11, 2008, 8:48 AM – March 11, 2008, 9:24 AM

  Authors

  • William Trogler

    • Department of Chemistry, University of California at San Diego

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• Materials Informatics: Using machine learning techniques with large amounts of ab-initio computed or experimental data

  COFFEE_KLATCH · Invited

  March 11, 2008, 9:24 AM – March 11, 2008, 10:00 AM

  Authors

  • Gerbrand Ceder

    • Massachusetts Institute of Technology

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