Soft X-Ray Spectroscopic studies of Intrinsic Quantum Well States, Shallow Core Level Hybridization, and Valence Band Structure in CdO and InN

InN and CdO are post-transition metal compounds that display significant metal-ligand shallow core level hybridization [1], and have recently been discovered to posses intrinsic quantum well states in electron accumulation layers near their surfaces [2]. We report here new synchrotron-based soft x-ray spectroscopic measurements of the electronic structure of CdO and InN single crystal thin films. Resonant x-ray emission spectroscopy has been employed to study the detailed valence band and shallow core level electronic structure, while high resolution angle-resolved photoemission spectroscopy was used to measure quantized electron subbands at the near-surface of both InN and CdO. [1]. L .F. J. Piper \textit{et al}., Phys. Rev. B (2007) \textit{in press; }[2]. L. Colakerol \textit{et al}., Phys. Rev. Lett. 97, 237601, (2006)