Experimental realization of a generalized superlens using negative refraction at infrared wavelengths

ORAL

Abstract

We demonstrate experimentally using a near-field scanning optical microscope the imaging of a point source by a generalized superlens fabricated in InGaAsP/InP heterostructure at wavelengths around $\lambda $= 1.5 $\mu $m. The theory of superlens imaging with lens equation u + v = $\sigma $d gives excellent explanation of wave refraction and imaging formation of our superlens with an effective lens property $\varepsilon _{eff}$= 0.43. This can be used as the basis for design optical elements made of photonic crystals.

–

Authors

  • Ravinder Banyal

    • Department of Physics and Electronic Materials Research Institute, Northeastern University, Boston, Massachusetts 02115, USA

  • B.D.F. Casse

    • Department of Physics and Electronic Materials Research Institute, Northeastern University, Boston, Massachusetts 02115, USA

  • W.T. Lu

    • Department of Physics and Electronic Materials Research Institute,Northeastern University, Boston, Massachusetts 02115, USA

  • Y.J. Huang

    • Department of Physics and Electronic Materials Research Institute,Northeastern University, Boston, Massachusetts 02115, USA

  • S. Selvarasah

  • M. Dokmeci

    • Department of Electrical and Computer Engineering, Northeastern University, Boston, Massachusetts 02115, USA

  • C.H. Perry

    • Department of Physics and Electronic Materials Research Institute, Northeastern University, Boston, Massachusetts 02115, USA

  • Srinivas Sridhar

    • Department of Physics and Electronic Materials Research Institute, Northeastern University, Boston, MA 02115
    • Department of Physics and Electronic Materials Research Institute, Northeastern University, Boston, Massachusetts 02115, USA
    • Northeastern University