X-ray diffraction and reciprocal space mapping in ZnMnGaO$_{4}$ films with checkerboard nanostructures

ORAL

Abstract

Reciprocal space maps (RSM) in ZnMnGaO$_{4}$ films with checkerboard nanostructures were measured with the energy of the x-ray beam of 10.53 keV at the A2 beamline at Cornell High Energy Synchrotron Source (CHESS) using a four-circle diffractometer. Structural properties of the checkerboards, such as elastic strain, relaxation effects, twists, and tilts of the nanodomains, were analyzed using H-K, H-L, and K-L cross sections of the RSM's measured around various symmetric and asymmetric reflections (022), (004), (044), (226), (222) of the spinel structure. Work at Rutgers was supported by the DE-FG02-07ER46382 and the NSF-DMR- 0706326. Work at NJIT was supported by the NSF-DMR-0546985. The Cornell High Energy Synchrotron Source is supported by the NSF and the NIH/NIGMS under Award No. DMR-0225180.

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Authors

  • A.A. Sirenko

    • NJIT

  • S.M. O'Malley

  • Peter Bonanno

    • New Jersey Institute of Technology
    • Department of Physics, New Jersey Institute of Technology, Newark, New Jersey 07102

  • A. Kazimirov

    • Cornell High Energy Synchrotron Source (CHESS), Cornell University, Ithaca, New York 14853

  • S. Park

    • Rutgers Univ.
    • Department of Physics and Astronomy, Rutgers University, Piscataway, New Jersey 08854, USA

  • S.-W. Cheong

    • Rutgers University
    • RCEM and Rutgers University, Piscataway, NJ
    • Rutgers University (Deparment of Physics)
    • Rutgers Univ.
    • Department of Physics and Astronomy, Rutgers University
    • Department of Physics and Astronomy, Rutgers University, Piscataway, New Jersey 08854, USA
    • Rutgers Center for Emergent Materials and Department of Physics \& Astronomy, Rutgers University, Piscataway, New Jersey 08854, USA
    • Rutgers Center for Emergent Materials and Department of Physics \& Astronomy, Rutgers University, Piscataway, New Jersey 08854