Focus Session: Advances in Scanned Probe Microscopy III: High Frequency and Probe Characterization
ORAL · U38 ·
Presentations
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Radio-frequency Scanning Tunneling Microscopy (rf-STM)
ORAL
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Authors
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Utku Kemiktarak
- Department of Physics, Boston University
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Tchefor Ndukum
- Department of Physics, Cornell University
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Keith Schwab
- Cornell University
- Department of Physics, Cornell University
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Kamil Ekinci
- Dept. of Aerospace and Mechanical Eng., Boston University
- Department of Aerospace and Mechanical Engineering, Boston University
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Very high frequency (VHF) self-sensing nanoscale cantilevers and their mass sensing applications in ambient conditions.
ORAL
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Authors
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Mo Li
- Kavli Nanoscience Institute and Department of Applied Physics, California Institute of Technology
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Hong Tang
- Kavli Nanoscience Institute and Department of Physics, California Institute of Technology
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Michael Roukes
- Kavli Nanoscience Institute and Departments of Physics, Applied Physics, and Bioengineering, California Institute of Technology
- California Institute of Technology
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High Frequency Cantilevers for Magnetic Resonance Force Microscopy
ORAL
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Authors
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Christian Degen
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Martino Poggio
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Ben Chui
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John Mamin
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Dan Rugar
- IBM Research Division, Almaden Research Center, San Jose, CA 95120
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Construction of a Low Temperature Capable Frequency-Modulation Magnetic Resonance Force Microscope
ORAL
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Authors
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SangGap Lee
- Department of Physics, Korea Advanced Institute of Science and Technology
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Sun Ho Won
- Department of Physics, Korea Advanced Institute of Science and Technology
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Seung-Bo Saun
- Department of Physics, Korea Advanced Institute of Science and Technology
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Soonchil Lee
- Department of Physics, Korea Advanced Institute of Science and Technology
- Dept. of Physics, KAIST, Korea
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MRFM System Design for the Study of Organic Materials
ORAL
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Authors
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Doran Smith
- U.S. Army Research Laboratory
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David Kim
- U.S. Army Research Laboratory
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Progress on Magnetic Resonance Force Microscopy Detection of Statistical Polarization of Electron Spins
ORAL
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Authors
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K.C. Fong
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I.H. Lee
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P. Banerjee
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Yu. Obukhov
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D. Pelekhov
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P.C. Hammel
- Department of Physics, Ohio State University, 191 West Woodruff Ave., Columbus OH 43210
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Cross Polarization Imaging with Magnetic Resonance Force Microscopy
ORAL
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Authors
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Kai W. Eberhardt
- ETH Zurich
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Qiong Lin
- ETH Zurich
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Andreas Hunkeler
- ETH Zurich
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Urban Meier
- ETH Zurich
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Beat H. Meier
- ETH Zurich
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Near-field scanning microwave microscope with separated excitation and sensing probes
ORAL
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Authors
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Keji Lai
- Stanford Univ.
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M.B. Ji
- Stanford Univ.
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N. Leindecker
- Stanford Univ.
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M. Kelly
- Stanford Univ.
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Z.-X. Shen
- Stanford Univ.
- Stanford U.
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Ferromagnetic resonance force microscopy of a permalloy film
ORAL
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Authors
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E. Nazaretski
- Los Alamos National Laboratory
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I. Martin
- Los Alamos National Laboratory
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J.D. Thompson
- Los Alamos National Laboratory
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R. Movshovich
- Los Alamos National Laboratory
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D.V. Pelekhov
- Ohio State University
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P.C. Hammel
- Ohio State University
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P. Wigen
- Ohio State University
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M. Zalalutdinov
- SFA Inc.
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T. Mewes
- University of Alabama
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J. Baldwin
- Naval Research Laboratory
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B. Houston
- Naval Research Laboratory
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Magnetic particle imaging with a cantilever torque magnetometer
ORAL
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Authors
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John Moreland
- NIST, Boulder, CO
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Jason Eckstein
- NIST, Boulder, CO
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Yushun Lin
- Department of Physics, University of Nebraska, Lincoln, NE
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Sy-Hwang Liou
- Department of Physics, University of Nebraska, Lincoln, NE
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Steven Ruggiero
- Department of Physics, University of Notre Dame, Notre Dame, IN
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Resonant Measurement of Coupling Forces Between Two Microcantilevers
ORAL
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Authors
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Onur Basarir
- Dept. of Aerospace and Mechanical Eng., Boston University
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Kamil Ekinci
- Dept. of Aerospace and Mechanical Eng., Boston University
- Department of Aerospace and Mechanical Engineering, Boston University
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Functional Probes for Scanning Probe Microscopy
ORAL
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Authors
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Kotone Akiyama
- IMR, Tohoku University
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Toyoaki Eguchi
- ISSP, The University of Tokyo
- The Institute for Solid State Physics, The University of Tokyo
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Toshu An
- ISSP, The University of Tokyo
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Y. Fujikawa
- IMR, Tohoku University
- Institute for Materials Research, Tohoku University, Sendai, Japan
- IMR, Tohoku Univ.
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Yukio Hasegawa
- ISSP, The University of Tokyo
- The Institute for Solid State Physics, The University of Tokyo
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T. Sakurai
- IMR, Tohoku University
- Institute for Materials Research, Tohoku University, Sendai, Japan
- IMR, Tohoku Univ.
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Determination of the cross-sectional area of the indenter in nano indentation tests
ORAL
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Authors
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Weidian Shen
- Surface Science and Nano-Tribology Laboratory, Department of Physics and Astronomy, Eastern Michigan University
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Jeremy McMinis
- Surface Science and Nano-Tribology Laboratory, Department of Physics and Astronomy, Eastern Michigan University
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Rene Crombez
- Surface Science and Nano-Tribology Laboratory, Department of Physics and Astronomy, Eastern Michigan University
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Eva Montalvo
- Surface Science and Nano-Tribology Laboratory, Department of Physics and Astronomy, Eastern Michigan University
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In-situ observation of the transformation process into the nano-contact of single shell carbon fullerene using TEM-STM
ORAL
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Authors
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Makoto Yoshida
- Department of Physics Tokyo Institute of Technology
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Yoshihiko Kurui
- Department of Physics Tokyo Institute of Technology
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Yoshifumi Oshima
- Department of Materials Science and Engineering Tokyo Institute of Technology
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Kunio Takayanagi
- Department of Physics Tokyo Institute of Technology
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Quantitative imaging of lateral stiffness using sub-{\AA}ngstrom oscillation amplitude nc-AFM
ORAL
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Authors
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Mehrdad Atabak
- Bilkent University, Turkey
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Sevil Ozer
- Bilkent University, Turkey
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H. Ozgur Ozer
- Trinity College, Dublin 2, Ireland
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Ahmet Oral
- Bilkent University, Turkey
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