Focus Session: Advances in Scanned Probe Microscopy II: Force Methods

Presentations

• AFM/STM with sub-Angstrom modulation.

  COFFEE_KLATCH · Invited

  March 7, 2007, 6:00 AM – March 7, 2007, 6:36 AM

  Authors

  • Markus Ternes

    • IBM Almaden Research Center and EPF Lausanne

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• Atomically-resolved surface imaging by low temperature atomic force microscopy using a quartz resonator

  ORAL

  March 7, 2007, 6:36 AM – March 7, 2007, 6:48 AM

  Authors

  • Toyoaki Eguchi

  • Yukio Hasegawa

    • ISSP, The University of Tokyo
    • The Institute for Solid State Physics, The University of Tokyo

  • Toshu An

  • Takahiro Nishio

  • M. Ono

  • Kotone Akiyama

    • The Insittute for Solid State Physics, The University of Tokyo

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• Imaging of electronic defect states in SiO2 and HfSiOx films with sub-nanometer spatial resolution by two-way Single Electron Tunneling Force Mircroscopy

  ORAL

  March 7, 2007, 6:48 AM – March 7, 2007, 7:00 AM

  Authors

  • J.P. Johnson

    • University of Utah

  • N. Zheng

    • University of Utah

  • C.C. Williams

    • University of Utah

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• Detection of Embedded nanostructures by Electrostatic Force Microscopy

  ORAL

  March 7, 2007, 7:00 AM – March 7, 2007, 7:12 AM

  Authors

  • Zonghai Hu

    • University of Pennsylvania

  • Yuanzhen Chen

    • University of Pennsylvania

  • Michael Fischbein

    • University of Pennsylvania

  • Robin Havener

    • University of Pennsylvania

  • Marija Drndic

    • University of Pennsylvania

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• Sinc or Sine? The Band Excitation Method and Energy Dissipation Measurements by SPM

  ORAL

  March 7, 2007, 7:12 AM – March 7, 2007, 7:24 AM

  Authors

  • Stephen Jesse

    • Oak Ridge National Laboratory

  • Sergei Kalinin

    • Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, TN 37831
    • Oak Ridge National Laboratory

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• Spring constant calibration of AFM cantilevers with a piezolever transfer standard

  ORAL

  March 7, 2007, 7:24 AM – March 7, 2007, 7:36 AM

  Authors

  • D. Hurley

    • NIST

  • E. Langlois

    • NIST

  • G. Shaw

    • NIST

  • J. Kramar

    • NIST

  • J. Pratt

    • NIST

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• High Speed Scanning Property Measurements

  ORAL

  March 7, 2007, 7:36 AM – March 7, 2007, 7:48 AM

  Authors

  • David Shuman

    • University of Connecticut

  • Ramesh Nath

    • University of Connecticut

  • Ramamoorthy Ramesh

    • University of California, Berkeley
    • Dept. of Materials Science and Engg, University of California, Berkeley, Berkeley, CA
    • UC Berkeley
    • Physics Department, University of California, Berkeley

  • Bryan Huey

    • University of Connecticut

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• Atomic Force Microscope Tip for Dielectrophoresis

  ORAL

  March 7, 2007, 7:48 AM – March 7, 2007, 8:00 AM

  Authors

  • J.A. Aguilar

    • Department of Physics, Harvard University, Cambridge, MA

  • T.P. Hunt

    • Department of Physics, Harvard University, Cambridge, MA

  • Ania Bleszynski

    • Dept of Physics, Yale Univ
    • Department of Physics, Yale University
    • Department of Physics, Yale University, New Haven, CT

  • Robert M. Westervelt

    • Dept of Physics and Div of Engineering \& Applied Sciences, Harvard Univ
    • Dept of Physics and Div of Eng and App Sci, Harvard Univ
    • Harvard University
    • Mallinckrodt Professor of Applied Physics and of Physics
    • Department of Physics, Harvard University, Cambridge, MA
    • Harvard DEAS
    • Department of Physics

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• Cantilever mean deflection: average tip-sample force in tapping mode spectroscopy

  ORAL

  March 7, 2007, 8:00 AM – March 7, 2007, 8:12 AM

  Authors

  • F. Michael Serry

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• ABSTRACT WITHDRAWN

  March 7, 2007, 8:12 AM – March 7, 2007, 8:24 AM

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• Monotonic and fatigue tests of amorphous silicon nanostructures using atomic force microscope

  ORAL

  March 7, 2007, 8:24 AM – March 7, 2007, 8:36 AM

  Authors

  • Churamani Gaire

    • Dept. of Physics, Rensselaer Polytechnic Institute, Troy, NY

  • D.-X. Ye

    • Dept. of Physics, Rensselaer Polytechnic Institute, Troy, NY

  • T.-M. Lu

    • Dept. of Physics, Rensselaer Polytechnic Institute, Troy, NY

  • G.-C. Wang

    • Dept. of Physics, Rensselaer Polytechnic Institute, Troy, NY

  • C. R. Picu

    • Dept. of Mech. Engg., Rensselaer Polytechnic Institute, Troy, NY

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• Enhanced compositional sensitivity in atomic force microscopy by the excitation of the first two flexural modes

  ORAL

  March 7, 2007, 8:36 AM – March 7, 2007, 8:48 AM

  Authors

  • Ricardo Garcia

    • Instituto de Microelectronica de Madrid, CSIC

  • Nicolas F. Martinez

    • Instituto de Microelectronica de Madrid, CSIC

  • Shivprasad Patil

    • Instituto de Microelectronica de Madrid, CSIC

  • Jose R. Lozano

    • Instituto de Microelectronica de Madrid, CSIC

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• Systematic Variations in Apparent Topographic Height as Measured by Non-contact Atomic Force Microscopy

  ORAL

  March 7, 2007, 8:48 AM – March 7, 2007, 9:00 AM

  Authors

  • Deng-Sung Lin

    • Institute of Physics, National Chiao-Tung University, Taiwan

  • T.-C. Chiang

    • Department of Physics, University of Illinois at Urbana-Champaign, USA

  • K.M. Yang

    • Institute of Physics, National Chiao-Tung University, Taiwan

  • J.Y. Chung

    • Institute of Physics, National Chiao-Tung University, Taiwan

  • M.F. Hsieh

    • Institute of Physics, National Chiao-Tung University, Taiwan

  • S.S. Ferng

    • Institute of Physics, National Chiao-Tung University, Taiwan

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