Focus Session: Advances in Scanned Probe Microscopy I: Low Temperatures, Manipulation,and Optical Methods I

Presentations

• An ultrahigh vacuum, variable temperature scanning tunneling microscope

  ORAL

  March 6, 2007, 12:30 PM – March 6, 2007, 12:42 PM

  Authors

  • E.W. Hudson

    • Massachusetts Institute of Technology
    • MIT

  • W. D. Wise

    • MIT

  • Kamalesh Chatterjee

    • MIT

  • M.C. Boyer

    • MIT

  View abstract →

• Scanning tunneling microscopy in high magnetic fields below 1 Kelvin

  ORAL

  March 6, 2007, 12:42 PM – March 6, 2007, 12:54 PM

  Authors

  • Andreas Heinrich

    • IBM Almaden Research Center
    • IBM-Almaden
    • IBM Research

  • Donald Eigler

    • IBM Research

  • Cyrus Hirjibehedin

    • IBM Research

  • Markus Ternes

    • IBM Research

  • Christopher Lutz

    • IBM Almaden Research Center
    • IBM Research

  View abstract →

• Construction of a sub-Kelvin ultra-high vacuum scanning tunneling microscope in high magnetic field

  ORAL

  March 6, 2007, 12:54 PM – March 6, 2007, 1:06 PM

  Authors

  • Ungdon Ham

    • Department of Physics and Astronomy, University of California, Irvine, CA 92697-4575, USA

  • Xi Chen

    • Department of Physics, Tsinghua University, Beijing 100084, P.R.China

  • Chi Chen

    • Department of Chemistry, University of California, Irvine, CA 92697-2025, USA

  • Freddy Toledo

    • Department of Chemistry, University of California, Irvine, CA 92697-2025, USA

  • Wilson Ho

    • Department of Physics and Astronomy and Department of Chemistry, University of California, Irvine, CA 92697-4575, USA

  View abstract →

• Design of a 20 mK/15 T STM system

  ORAL

  March 6, 2007, 1:06 PM – March 6, 2007, 1:18 PM

  Authors

  • Young Jae Song

    • National Institute of Standards and Technology

  • Steve Blankenship

    • National Institute of Standards and Technology

  • Jason Crain

    • Center for Nanoscale Science and Technology, NIST, Gaithersburg, MD 20899
    • Center for Nanoscale Science and Technology, NIST, Gaithersburg, MD 20899-8412, USA
    • National Institute of Standards and Technology

  • Joseph Stroscio

    • Center for Nanoscale Science and Technology, NIST, Gaithersburg, MD 20899-8412, USA
    • National Institute of Standards and Technology

  View abstract →

• Atomistic constructions using a scanning tunneling microscope.

  ORAL

  March 6, 2007, 1:18 PM – March 6, 2007, 1:30 PM

  Authors

  • Aparna Deshpande

  • Joel Vaughn

  • Saw-Wai Hla

    • Ohio University

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• Scanning Tunneling Microscope Manipulation of $\beta$-Carotene on Au(111) at 4.6 K

  ORAL

  March 6, 2007, 1:30 PM – March 6, 2007, 1:42 PM

  Authors

  • Timur Skeini

    • Ohio University

  • Violeta Iancu

    • Ohio University

  • Saw W. Hla

    • Ohio University
    • OU

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• Vertical Atom Manipulation on GaN(000$\overline 1 $) Surface at Low Temperature

  ORAL

  March 6, 2007, 1:42 PM – March 6, 2007, 1:54 PM

  Authors

  • Danda P. Acharya

    • OU

  • Kendal Clark

    • OU

  • Saw W. Hla

    • Ohio University
    • OU

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• Design and Construction of a UHV-LT-STM for Tip-Enhanced Optics.

  ORAL

  March 6, 2007, 1:54 PM – March 6, 2007, 2:06 PM

  Authors

  • D.R. Daughton

  • D. Lee

  • N. Ezeh

  • J.A. Gupta

    • Department of Physics, The Ohio State University

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• Stress Imaging in Indented Si Wafers by Confocal Raman Microscopy

  ORAL

  March 6, 2007, 2:06 PM – March 6, 2007, 2:18 PM

  Authors

  • Jeroen Schoenmaker

    • Surface and Microanalysis Science Division - NIST - Gaithersburg, MD.

  • Robert F. Cook

    • Ceramics Division - NIST - Gaithersburg, MD.

  • Lukas Novotny

    • The Institute of Optics, U. of Rochester, Rochester, NY.

  • Stephan J. Stranick

    • Surface and Microanalysis Science Division - NIST - Gaithersburg, MD.

  View abstract →

• Tip Enhanced Raman Scattering of Strained Silicon with Single and Multiple Probe Scanned Probe Microscopes.

  ORAL

  March 6, 2007, 2:18 PM – March 6, 2007, 2:30 PM

  Authors

  • Aaron Lewis

    • Nanonics Imaging Ltd.

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• High Efficiency Surface Plasmon Enhanced Near-field Scanning Optical Microscope Probe Development.

  ORAL

  March 6, 2007, 2:30 PM – March 6, 2007, 2:42 PM

  Authors

  • R.E. Hollingsworth

    • ITN Energy Systems
    • ITN Energy Systems, Inc
    • ITN Energy Systems Inc

  • G.J. Nuebel

    • ITN Energy Systems Inc

  • I.C. Schick

    • Colorado School of Mines

  • P.D. Flammer

    • Colorado School of Mines

  • J.T. Martineau

    • Colorado School of Mines

  • M.A. Hurowitz

    • Colorado School of Mines

  • R.T. Collins

    • Colorado School of Mines

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• A Silicon MEMS Probe Integrated with Light Emitting Nanoparticles on Tip for Near-field Scanning Optical Microscopy

  ORAL

  March 6, 2007, 2:42 PM – March 6, 2007, 2:54 PM

  Authors

  • X. Zhang

    • The University of Texas at Austin

  • K. Hoshino

    • The University of Texas at Austin

  • L. Rozanski

    • The University of Texas at Austin

  • D. Vanden Bout

    • The University of Texas at Austin

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• Spectroscopic near-field microscopy using frequency combs in the mid-infrared

  ORAL

  March 6, 2007, 2:54 PM – March 6, 2007, 3:06 PM

  Authors

  • Markus Brehm

    • Max Planck Institute of Biochemistry, Martinsried (Muenchen), Germany

  • Albert Schliesser

    • Max Planck Institute of Biochemistry, Martinsried (Muenchen), Germany

  • Fritz Keilmann

    • Max Planck Institute of Biochemistry, Martinsried (Muenchen), Germany

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• Element specific imaging by STM combined with synchrotron radiation light

  ORAL

  March 6, 2007, 3:06 PM – March 6, 2007, 3:18 PM

  Authors

  • Toyoaki Eguchi

    • ISSP, The University of Tokyo
    • The Institute for Solid State Physics, The University of Tokyo

  • Taichi Okuda

  • Takeshi Matsushima

  • Akira Kataoka

  • Ayumi Harasawa

  • Kotone Akiyama

  • Toyohiko Kinoshita

  • Yukio Hasegawa

    • The Institute for Solid State Physics, The University of Tokyo

  View abstract →

• Waveguide Characterization Using Shear Force Scanning Optical Microscopy.

  ORAL

  March 6, 2007, 3:18 PM – March 6, 2007, 3:30 PM

  Authors

  • Rongjin Yan

  • G. Yuan

  • R. Pownall

  • K. Lear

    • Elec. \& Comp. Engr. Dept. Colorado State University

  View abstract →