Capturing and Expulsion Processes of DNA Translocations in Solid-State Nanopores

We study the DNA translocation dynamics through voltage biased solid-state nanopores. Our study examines the capturing and expulsion process of translocation events at various conditions, and compares them to artificial events. For events with translocation time on the order of 100 $\mu $s a significant portion of the translocation event corresponds to the transitory process of the DNA entering and exiting the nanopore, which is normally included in the overall translocation time. Our study reveals that DNA enter the nanopore with a higher speed than on exit. The limitations of the electronic response of the measurement system will also be discussed.