Ferroelectric Phase Transition Study of Coupling KTN Perovskites Oxide by Scanning Microwave Microscope.

ORAL

Abstract

We used a scanning near field microwave microscope to determine the thin film dielectric properties of KTN near transition temperature. For solid solution K(NbxTa1-x)O3 thin film deposited on MgAl2O3 substrate a 1st order phase transition was observed and for KTN 1x1 super lattice two 2nd order phase transitions were observed. Then a finite element method simulation was applied to numerically calculate the dielectric constant of the samples in difference phases. The results show a strong consistent with the previous x-ray and capacitance measurements.

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Authors

  • Shuogang Huang

    • Department of Physics, George Washington University

  • Mark Reeves

    • Department of Physics, George Washington University

  • Jennifer Sigman

    • Department of Materials Science and Engineering, University of Florida

  • David Norton

    • Department of Materials Science and Engineering, University of Florida

  • Hans Christen

    • Solid State Division, Oak Ridge National Laboratory