Measurements of 1/f Noise in Carbon Nanotube Devices

ORAL

Abstract

We have measured the low frequency noise of field effect transistors made from individual single-walled carbon nanotubes in an ultra high vacuum environment. We will compare Hooge’s constants measured in oxygen, argon, air, and ultra high vacuum, and propose a possible solution for reducing noise in nanotube devices. Furthermore, the utility of noise amplitude in carbon nanotube devices for chemical specific sensing will be discussed.

*Materials Research Science and Engineering Center at University of Maryland, College Park and Director of Central Intelligence Postdoctoral Fellowship Program

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Authors

  • Masa Ishigami

    • Department of Physics, University of Maryland, College Park, Maryland 20742

  • W. X. Yan

    • Thomas Jefferson High School for Science and Technology, Alexandria VA 22312

  • J.H. Chen

  • M. S. Fuhrer

  • E. D. Williams

    • Department of Physics, University of Maryland, College Park, Maryland 20742