COBRA Studies of Ultrathin Ferroelectric Oxide Films

ORAL

Abstract

We used Coherent Bragg Rod Analysis (COBRA) and x-ray synchrotron radiation to investigate the structure of epitaxial thin films of PbTiO$_{3}$ deposited by sputtering on SrTiO$_{3}$ substrates. The measurements were performed under different electric field conditions, including the presence of conducting electrodes. The data analysis reveals details of the atomic displacements in different layers and shows subtle variations as a function of distance from the interface. The effects of symmetry breaking at the substrate-film interface are discussed.

*Use of the Advanced Photon Source was supported by the U. S. Department of Energy, Office of Science, Office of Basic Energy Sciences, under Contract No. W-31-109-Eng-38 and Grant No. DE-FG02-03ER46023.

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Authors

  • Codrin Cionca

    • University of Michigan
    • Applied Physics, University of Michigan

  • D.P. Kumah

    • Applied Physics, University of Michigan

  • C-B Eom

    • Materials Science and Engineering, University of Wisconsin-Madison

  • D-M Kim

    • Materials Science and Engineering, University of Wisconsin-Madison

  • Y. Yacoby

    • Racah Institute of Physics, Hebrew University, Jerusalem, Israel

  • D.A. Walko

    • Advanced Photon Source, Argonne National Laboratory

  • R. Clarke

    • Applied Physics, University of Michigan