Sub-micron void structure during spallation fracture

ORAL

Abstract

Samples of single and poly-crystal aluminum were shocked to incipient spallation fracture and recovered on the LLNL light gas gun. Previously, we analyzed the void structure in these samples using 3D x-ray tomography. Here, we extend this analysis to sub-micron length scales using ultra-small-angle scattering (USAXS and USANS). The USANS data overlaps in length-scale with the tomography data. The data displays novel power law scaling and a Guinier region suggesting a mean size for sub-micron voids of 60nm. These results will be compared to direct numerical simulation using molecular dynamics.

*Work performed under the auspices of the U.S. DOE by University of California, LLNL under Contract W-7405-Eng-48, at APS under Contract No. W-31-109-ENG-38.

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Authors

  • James Belak

  • John Kinney

  • Mukul Kumar

    • Lawrence Livermore National Laboratory

  • J. Ilavsky

    • Advanced Photon Source

  • Lyle Levine

    • National Institute of Standards and Technology