Experiments on the Goos-H\"{a}nchen shift with negative and positive index of refraction materials

ORAL

Abstract

~ The negative Goos-H\"{a}nchen shift occurs when a beam of radiation having a finite transverse extent undergoes total internal reflection at a positive to negative index of refraction interface, hence the reflected beam experiences a negative lateral shift. This phenomenon has been predicted for materials with a negative index of refraction. We investigate a composite wire and split-ring resonator medium between 8-12 GHz, based on that first implemented by [1]. In addition, we present an experiment to investigate the Goos-H\"{a}nchen shift and show preliminary results on transmission, refraction, and total internal reflection. Work supported by NSF/ECS-0322844. [1] R. Shelby, D. R. Smith and S. Schultz, Science, 292, 77 (2001)

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Authors

  • Nathan Orloff

  • Michael Ricci

    • Univ. of Maryland, College Park

  • Collin Anderson

    • Yale University

  • Christian Long

  • Sudeep Dutta

  • Steven Anlage

    • Univ. of MD-College Park, USA.
    • CSR, Physics Dept., University of Maryland, USA
    • Center for Superconductivity, Department of Physics, University of Maryland, College Park, MD 20742
    • Center for Superconductivity Research, Department of Physics, University of Maryland, College Park
    • Univ. of Maryland, College Park
    • University of Maryland, College Park
    • Dept of Physics, Univ of Maryland, College Park
    • Center for Superconductivity Research, Department of Physics, University of Maryland