Parallel and High-Throughput Experimentation for the Physical Sciences: Methods, Applications and Technology Development

Presentations

• Combinatorial method for materials screening and device optimization of thin layer opto-electronic devices

  COFFEE_KLATCH · Invited

  March 25, 2005, 8:15 AM – March 25, 2005, 8:51 AM

  Authors

  • Hans-Werner Schmidt

    • Universit\"at Bayreuth, Makromolekulare Chemie I

  View abstract →

• Sensor Platforms for High-Throughput Analysis of Materials Libraries

  COFFEE_KLATCH · Invited

  March 25, 2005, 8:51 AM – March 25, 2005, 9:27 AM

  Authors

  • Radislav Potyrailo

    • GE Global Research

  View abstract →

• Gradient and High-Throughput Methods for the Accelerated Development of Nanomaterials and Nanometrology

  COFFEE_KLATCH · Invited

  March 25, 2005, 9:27 AM – March 25, 2005, 10:03 AM

  Authors

  • Michael Fasolka

    • Polymers Division, National Institute of Standards and Technology (NIST), NIST Combinatorial Methods Center, Gaithersburg, MD 20899
    • NIST, Polymers Division

  View abstract →

• Combinatorial thin film methodology for rapid investigation of composition-structure-property relationship in complex multifunctional materials

  COFFEE_KLATCH · Invited

  March 25, 2005, 10:03 AM – March 25, 2005, 10:39 AM

  Authors

  • Ichiro Takeuchi

    • University of Maryland

  View abstract →

• COFFEE_KLATCH · Invited

  March 25, 2005, 10:39 AM – March 25, 2005, 11:15 AM

  Authors

  • Oleg Kolosov

    • Symyx

  View abstract →