Focus Session: Multifunctional Oxides II

Presentations

• Molecular beam epitaxy for advanced gate stack materials and processes

  COFFEE_KLATCH · Invited

  March 23, 2005, 5:00 AM – March 23, 2005, 5:36 AM

  Authors

  • Jean-Pierre Locquet

    • IBM Research Zurich

  View abstract →

• Interface Electrostatics and the Schottky Barrier for Alkaline Earth Oxides on Silicon

  ORAL

  March 23, 2005, 5:36 AM – March 23, 2005, 5:48 AM

  Authors

  • Rodney McKee

    • Oak Ridge National Laboratory

  • Fred Walker

  • Curt Billman

    • Oak Ridge National Laboratory

  View abstract →

• Magnetoelectric interactions in single crystal ferrite-piezoelectric bilayers

  ORAL

  March 23, 2005, 5:48 AM – March 23, 2005, 6:00 AM

  Authors

  • V. M. Petrov

  • C. S. Flattery

    • Oakland University, Rochester, MI

  • G. Srinivasan

  • C. P. DeVreugd

  • M. I. Bichurin

  • A. A. Ivanov

    • Novgorod State University, Russia

  • J. Zhai

  • S. Dong

  • D. Viehland

    • Virginia Polytechnic and State University, Blacksburg, VA

  View abstract →

• Properties of a ferromagnetic semiconductor: epitaxial Co-doped SnO2 films

  ORAL

  March 23, 2005, 6:00 AM – March 23, 2005, 6:12 AM

  Authors

  • James Burst

  • Matthias Batzill

  • Ulrike Diebold

    • Tulane University

  View abstract →

• Probing Enhanced Ferroelectricity in Strained SrTiO3 and BaTiO3 Epitaxial Films using optical Second Harmonic Generation

  ORAL

  March 23, 2005, 6:12 AM – March 23, 2005, 6:24 AM

  Authors

  • Alok Sharan

  • Aravind Vasudeva Rao

  • Venkatraman Gopalan

    • Materials Research Inst., Penn State Univ.

  • Mike Biegalski

  • Darrell G. Schlom

    • Dept. of Materials Science and Engineering, Penn State Univ.

  • Yulan L. Li

  • Long-Qing Chen

  • Kyoung Jin Choi

  • Chang Beom Eom

    • Dept. of Materials Science and Engineering, Univ. of Wisconsin-Madison

  View abstract →

• Anisotropic epitaxial strain effect on the charge-order phase of Nd$_{0.5}$Sr$_{0.5}$MnO$_{3}$

  ORAL

  March 23, 2005, 6:24 AM – March 23, 2005, 6:36 AM

  Authors

  • Masao Nakamura

    • Dept. of Appl. Phys., Univ. of Tokyo

  • Yasushi Ogimoto

    • Devices Tech. Res. Labs., Sharp Corp.

  • Hiroharu Tamaru

    • RCAST, Univ. of Tokyo

  • Makoto Izumi

    • RCAST, Univ. of Tokyo

  • Kenjiro Miyano

    • RCAST, Univ. of Tokyo

  View abstract →

• Magnetoelectric effect in nanostructured multiferroic ferrite-ferroelectric composite films

  ORAL

  March 23, 2005, 6:36 AM – March 23, 2005, 6:48 AM

  Authors

  • S.C. Chae

  • H.J. Ryu

  • D.H. Kim

  • T.W. Noh

    • ReCOE \& School of Physics, Seoul Natl. Univ., Korea

  • C.J. Bae

  • J. G. Park

    • Department of Physics, SungKyunKwan Univ., Korea

  • Y.S. Oh

  • K.H. Kim

    • CSCMR \& School of Physics, Seoul Natl. Univ., Korea

  View abstract →

• SrTiO3 single crystal field-effect transistor with an amorphous CaHfO3 gate insulator

  ORAL

  March 23, 2005, 6:48 AM – March 23, 2005, 7:00 AM

  Authors

  • Keisuke Shibuya

  • Tsuyoshi Ohnishi

  • Takayuki Uozumi

  • Mikk Lippmaa

    • The University of Tokyo

  • Hideomi Koinuma

    • Tokyo Institute of Technology

  View abstract →

• Hydrogen-induced defect generation in amorphous SiO$_{2}$

  ORAL

  March 23, 2005, 7:00 AM – March 23, 2005, 7:12 AM

  Authors

  • Masayasu Miyata

    • Seiko-Epson Corp.

  • Adri van Duin

    • California Institute of Technology

  • Jamil Tahir-Kheli

  • William A. Goddard, III

    • California Institute of Technology
    • Materials and Process Simulation Center, California Institute of Technology
    • MSC, Caltech
    • Caltech

  View abstract →

• High temperature oxidation studies of filtered arc deposited CrAlN nanolayered coatings on steel plates

  ORAL

  March 23, 2005, 7:12 AM – March 23, 2005, 7:24 AM

  Authors

  • A. Kayani

  • C.V. Ramana

  • R.J. Smith

    • Physics Department, Montana State University-Bozeman, MT 59717

  • V.I. Gorokhovsky

    • Arcomac Surface Engineering, LLC. Bozeman, MT 59715

  • V. Shutthanandan

    • Pacific Northwest National Laboratory, Richland, WA 99302

  View abstract →