Dependence of the intrinsic noise properties of Nb/AlOx/Nb-junctions on the manufacturing geometry

POSTER

Abstract

We have studied different Nb/AlOx/Nb-junctions and their $1/f$ -noise properties. We compare the results with Al-based junctions and SETs and discuss the role of the sample geometry and the underlying substrate. At certain bias voltages, which is specific for each sample, the Nb-based junctions have an anomalous AC-current, which frequency strongly depends on the applied bias voltage.

Authors

  • Pasi Kivinen

    • Department of Physics, University of Jyvaskyla, P.O. Box 35, 40014 Jyvaskyla, Finland

  • Sorin Paraoanu

  • Ari Halvari

  • Paivi Torma