Effect of Metal-Carbon Nanotube Interface in Carbon Nanotube Devices

Zhengfan Zhang; Venkat Chandrasekhar

Effect of Metal-Carbon Nanotube Interface in Carbon Nanotube Devices

ORAL

Abstract

The four-terminal contact resistance of individual multiwalled carbon nanotubes with Au/Ti electrodes was measured at low temperature. The contact resistance as a function of bias voltage showed large asymmetric behavior. At zero bias, the contact resistance showed large variations with gate voltage. The origin of this asymmetric behavior and the the correlation between nanotube device resistance and contact resistance will be discussed.

^*Supported by National Science Foundation through grant number CCF-0403590

March 21, 2005, 6:48 AM – March 21, 2005, 7:00 AM

Authors

Zhengfan Zhang
- Department of Physics and Astronomy, Northwestern University, Evanston, IL 60208
Venkat Chandrasekhar
- Department of Physics and Astronomy, Northwestern University
- Physics and Astronomy, Northwestern University
- Department of Physics and Astronomy, Northwestern University, Evanston, IL 60208