Focus Session: Semiconductor Characterization

Presentations

• Interface Sensitive Measurement of High k - silicon dioxide – silicon system using Optical Second Harmonic Generation

  COFFEE_KLATCH · Invited

  March 21, 2005, 5:00 AM – March 21, 2005, 5:36 AM

  Authors

  • Alain Diebold

    • SEMATECH

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• Measurement of the Full State of Stress of Silicon with Micro-Raman Spectroscopy

  ORAL

  March 21, 2005, 5:36 AM – March 21, 2005, 5:48 AM

  Authors

  • Stephen Harris

  • Ann O'Neill

  • Wen Yang

  • Peter Gustafson

  • James Boileau

    • Ford Research and Advanced Engineering

  • Willes H. Weber

    • University of Michigan
    • APS

  • Bhaskar Majumdar

    • New Mexico Tech

  • Somnath Ghosh

    • Ohio State University

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• UV-Raman deformation coefficients in Si and SiGe alloys

  ORAL

  March 21, 2005, 5:48 AM – March 21, 2005, 6:00 AM

  Authors

  • Michael Canonico

    • Freescale Semiconductor

  • Ran Liu

    • Fudan University

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• In-situ photovoltage shift measurements of hafnium oxides and silicates grown on Si(100) using femtosecond photoelectron spectroscopy

  ORAL

  March 21, 2005, 6:00 AM – March 21, 2005, 6:12 AM

  Authors

  • Daeyoung Lim

    • IBM T. J. Watson Research Center

  • Richard Haight

    • IBM T. J. Watson Research Center

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• An infrared probe of tunable dielectrics in metal-oxide-semiconductor structures

  ORAL

  March 21, 2005, 6:12 AM – March 21, 2005, 6:24 AM

  Authors

  • Kevin Mikolaitis

  • Zhiqiang Li

    • University of California, San Diego

  • Guangming Wang

  • Alan J. Heeger

    • University of California, Santa Barbara
    • Institute for Polymers and Organic Solids, University of California, Santa Barbara, CA 93106

  • Dimitri Basov

    • Department of Physics, University of California San Diego, La Jolla, California 92093-0319
    • Department of Physics, University of California at San Diego, La Jolla, CA 92093-0319
    • University of California, San Diego
    • UCSD

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• High Resolution 2D Dopant Profiling of FinFET Structures using Scanning Probe Microscopy

  ORAL

  March 21, 2005, 6:24 AM – March 21, 2005, 6:36 AM

  Authors

  • Alexander Khajetoorians

  • Jianlong Li

    • Department of Physics, University of Texas at Austin

  • Li Shi

    • Department of Mechanical Engineering, University of Texas at Austin

  • Xiang-Dong Wang

    • Freescale Semiconductor

  • Chih-Kang Shih

    • Physics Department, The University of Texas at Austin, Austin, Texas, 78712
    • University of Texas at Austin
    • The University of Texas at Austin
    • Department of Physics, University of Texas at Austin

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• High-Resolution Microcalorimeters for X-ray Microanalysis

  ORAL

  March 21, 2005, 6:36 AM – March 21, 2005, 6:48 AM

  Authors

  • B.L. Zink

  • G.C. Hilton

  • J.N. Ullom

  • K.D. Irwin

    • Quantum Sensors Project, National Institute of Standards and Technology, Boulder, CO 80305

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• High-resolution characterization of advanced interconnect and packaging architectures

  ORAL

  March 21, 2005, 6:48 AM – March 21, 2005, 7:00 AM

  Authors

  • Shriram Ramanathan

    • Components Research, Intel Corp.

  • Evan Pickett

    • Intel

  • Patrick Morrow

    • Intel

  • Yongmei Liu

    • Intel

  • Rajen Dias

    • Intel

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• Direct Imaging of Minority Carrier Drift in Luminescent Materials

  ORAL

  March 21, 2005, 7:00 AM – March 21, 2005, 7:12 AM

  Authors

  • David Luber

  • Nancy Haegel

    • Naval Postgraduate School

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• Contact-free approach for the determination of minority carrier diffusion length

  ORAL

  March 21, 2005, 7:12 AM – March 21, 2005, 7:24 AM

  Authors

  • F.M. Bradley

  • Will Freeman

  • Nancy Haegel

    • Naval Postgraduate School

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• Structural and morphological characterization of GaN(0001) layers grown on SiC by maskless pendeo-epitaxy via X-ray Microdiffraction

  ORAL

  March 21, 2005, 7:24 AM – March 21, 2005, 7:36 AM

  Authors

  • R.I. Barabash

  • G.E. Ice

    • Oak Ridge National Laboratory

  • S. Einfeldt

  • D. Hommel

    • University of Bremen

  • A.M. Roskovski

  • R.F. Davis

    • North Carolina State University

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• UHV Nanoworkbench and the `Roaming' Field Effect Transistor

  ORAL

  March 21, 2005, 7:36 AM – March 21, 2005, 7:48 AM

  Authors

  • Olivier Guise

  • John T. Yates, Jr.

    • Surface Science Center, Center for Oxide Semiconductor Materials for Quantum Computation, Dept of Chem., Univ. of Pittsburgh

  • Joachim Ahner

    • Seagate Technology

  • Jeremy Levy

    • Dept. of Physics and Astronomy, University of Pittsburgh
    • Department of Physics and Astronomy, University of Pittsburgh, Pittsburgh, PA 15260
    • University of Pittsburgh
    • Surface Science Center, Center for Oxide Semiconductor Materials for Quantum Computation, Dept of Physics and Astronomy, Univ. of Pittsburgh

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• An investigation of dopping profile for a one dimensional heterostructure

  ORAL

  March 21, 2005, 7:48 AM – March 21, 2005, 8:00 AM

  Authors

  • ZhaoHui Huang

  • Dragan Stojkovic

  • Paul Lammert

  • Vincent Crespi

    • Department of Physics, The Pennsylvania State University

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