Plasma Diagnostics III

FOCUS · ER2 · ID: 3429881






Presentations

  • ORAL · Invited

    Publication: Mrkvičková M. et al., Combustion and Flame 241 (2022), 112100.
    Dvořák P. et al., Front. Phys. 12 (2024), 1408078.
    Dvořák, P. et al., J Fluoresc (2025).

    Presenters

    • Martina Mrkvičková

      • Department of Plasma Physics and Technology, Masaryk University, Brno, Czechia

    Authors

    • Martina Mrkvičková

      • Department of Plasma Physics and Technology, Masaryk University, Brno, Czechia
    • Pavel Dvořák

      • Department of Plasma Physics and Technology, Masaryk University, Brno, Czechia
    • Tomáš Medek

      • Department of Plasma Physics and Technology, Masaryk University, Brno, Czechia
    • Michal Pazderka

      • Department of Plasma Physics and Technology, Masaryk University, Brno, Czechia
    • Waseem Khan

      • Department of Plasma Physics and Technology, Masaryk University, Brno, Czechia
    • Nima Bolouki

      • Department of Plasma Physics and Technology, Masaryk University, Brno, Czechia
    • Adam Obrusník

      • Department of Plasma Physics and Technology, Masaryk University, Brno, Czechia
    • Milan Svoboda

      • Institute of Analytical Chemistry of the Czech Academy of Sciences, Brno, Czechia
    • Jiří Dědina

      • Institute of Analytical Chemistry of the Czech Academy of Sciences, Brno, Czechia
    • Jan Kratzer

      • Institute of Analytical Chemistry of the Czech Academy of Sciences, Brno, Czechia

    View abstract →

  • ORAL

    Publication: D.Y. Hwang, H.J. Yeom, G. Lee, J.H. Kim, and H.C. Lee, "Transmission spectrum analysis of ceramic-shielded microwave cutoff probes in low-pressure plasmas," J. Appl. Phys. 135(22), (2024); doi: 10.1063/5.0214696

    Presenters

    • Do-Yeon Hwang

      • Korea Research Institute of Standards and Science

    Authors

    • Do-Yeon Hwang

      • Korea Research Institute of Standards and Science
    • Hee-Jung Yeom

      • Korea Research Institute of Standards and Science
    • Wooram Kim

      • Korea Research Institute of Standards and Science
    • Gawon Lee Lee

      • Chungnam National University
    • Jung-Hyung Kim

      • Korea Research Institute of Standards and Science
    • Hyo-Chang Lee

      • Korea Aerospace University

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  • ORAL

    Presenters

    • InYong Park

      • Semiconfuctor Equipment Research Center, Korea Institute of Machinery and Materials
      • Korea Institute of Machinery and Materials

    Authors

    • InYong Park

      • Semiconfuctor Equipment Research Center, Korea Institute of Machinery and Materials
      • Korea Institute of Machinery and Materials
    • SangHo Lee

      • Semiconfuctor Equipment Research Center, Korea Institute of Machinery and Materials
      • Korea Institute of Machinery and Materials
    • GeonWoong Eom

      • Semiconfuctor Equipment Research Center, Korea Institute of Machinery and Materials
    • Woo Seok Kang

      • Semiconfuctor Equipment Research Center, Korea Institute of Machinery and Materials
      • Korea Institute of Machinery and Materials
    • Min Hur

      • Semiconfuctor Equipment Research Center, Korea Institute of Machinery and Materials
      • Korea Institute of Machinery and Materials
    • Dae-Woong Kim

      • Semiconfuctor Equipment Research Center, Korea Institute of Machinery and Materials
      • Korea Institute of Machinery and Materials

    View abstract →

  • ORAL

    Presenters

    • Gwang-Seok Chae

      • Korea Aerospace University

    Authors

    • Gwang-Seok Chae

      • Korea Aerospace University
    • Min Young Yoon

      • Korea Aerospace University
    • Hee-Jung Yeom

      • Korea Research Institute of Standards and Science
    • Eun-Seok Choe

      • Korea Research Institute of Standards and Science
    • Jung-Hyung Kim

      • Korea Research Institute of Standards and Science
    • Hyo-Chang Lee

      • Korea Aerospace University

    View abstract →