A Study of Self-Bias Formation in Low Electron Temperature Plasmas

ORAL

Abstract

The formation of self-bias voltage in low electron temperature plasma was studied. The low electron temperature plasma was generated by varying the grid voltage installed in the inductively coupled plasma (ICP). At a constant electron density of 1×1010 cm-3 and constant 12.5 MHz bias power (5 W), the self-bias voltage was measured to be -7.5 V at an electron temperature of 0.4 eV, and -9.9 V at 2.4 eV. Experimental results show that the substrate self-bias voltage varies with electron temperature. This difference arises from the sheath length. Since the sheath length is inversely proportional to electron temperature, the lower electron temperature plasma has longer sheath lengths. Therefore, the sheath capacitance increases as electron temperature decreases. These results suggest that in plasmas with lower electron temperatures, the ion energy is expected to be lower under the same RF bias power.

*This work was supported by the MOTIE(Ministry of Trade, Industry & Energy) (1415187403) and KSRC(Korea Semiconductor Research Consortium) (RS-2023-00237362) support program for the development of the future semiconductor device.

Presenters

  • Chang-Min Lim

    • Hanyang University

Authors

  • Chang-Min Lim

    • Hanyang University
  • Min-Seok Kim

    • Hanyang University
  • Junyoung Park

    • Hanyang university
  • Jaehwi Kim

    • Hanyang University
  • Yujin Yeo

    • Hanyang university
  • Chin-Wook Chung

    • Department of electrical engineering, Hanyang University, Seoul, Korea1
    • Hanyang University