Plasma Deposition & Damage

FOCUS · FT3 · ID: 1530570





Presentations

  • ORAL · Invited

    Presenters

    • Jianping Zhao

      • Tokyo Electron America

    Authors

    • Jianping Zhao

      • Tokyo Electron America
    • John Carroll

      • Tokyo Electron America
    • Peter L Ventzek

      • Tokyo Electron America
    • Charles Schlechte

      • Tokyo Electron America
    • Tsung-Hsuan Yang

      • University of Texas at Austin
    • Ting-Ya Wang

      • University of Texas at Austin
    • Samuel Johnson

      • University of Texas at Austin
    • John G Ekerdt

      • University of Texas at Austin
    • Gyeong S Hwang

      • University of Texas at Austin

    View abstract →

  • ORAL

    Publication: [1] Y. Kobayashi et al., "Current Status and Needs in the Future of Ceramics Used for Semiconductor Production Equipment", Proc. 37th Seminar on High-Temperature Ceramics, K. Matsuhiro, Ed., July 19, 2005 (Osaka, Japan), Japan Ceramics Society, 2005, p 1-7 (in Japanese)
    [2] M. Kindelmann et al., "Erosion behavior of Y2O3 in fluorine-based etching plasmas: Orientation dependency and reaction layer formation," Journal of the American Ceramic Society, vol. 104, no. 3, pp. 1465–1474, Mar. 2021, doi: 10.1111/jace.17556.

    Presenters

    • Bat-Orgil Erdenezaya

      • Kanazawa University

    Authors

    • Bat-Orgil Erdenezaya

      • Kanazawa University
    • Hirochika Uratani

      • Division of Electrical Engineering and Computer Science, Kanazawa University, Ishikawa, Japan
    • Ruka Yazawa

      • Nanomaterials Research Institute, Kanazawa University, Ishikawa, Japan
    • Md. Shahiduzzaman

      • Nanomaterials Research Institute, Kanazawa University, Ishikawa, Japan
    • Tetsuya Taima

      • Nanomaterials Research Institute, Kanazawa University, Ishikawa, Japan
    • Yusuke Nakano

      • Division of Electrical Engineering and Computer Science, Kanazawa University, Ishikawa, Japan
    • Yasunori Tanaka

      • Division of Electrical Engineering and Computer Science, Kanazawa University, Ishikawa, Japan
    • Tatsuo Ishijima

      • Division of Electrical Engineering and Computer Science, Kanazawa University, Ishikawa, Japan

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  • ORAL · Invited

    Publication: Foundations of atomic-level plasma processing in nanoelectronics, K. Arts, S. Hamaguchi, T. Ito, K. Karahashi, H.C.M. Knoops, A.J.M. Mackus, W.M.M. Kessels, Plasma Sources Sci. Technol. 31, 103002 (2022).

    Presenters

    • Erwin Kessels

      • Eindhoven University of Technology

    Authors

    • Erwin Kessels

      • Eindhoven University of Technology

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  • ORAL

    Presenters

    • Eun-Seok Choe

      • Korea Research Institute of Standards and Science

    Authors

    • Eun-Seok Choe

      • Korea Research Institute of Standards and Science
    • Seungwook Choi

      • UST (University of Science and Technology)
    • Ansoon Kim

      • UST (University of Science and Technology)
    • Kwan-Yong Kim

      • Korea Research Institute of Standards and Science
    • HeeJung Yeom

      • Korea Research Institute of Standards and Science
    • Min Young Yoon

      • Korea Research Institute of Standards and science
    • Seongwan Hong

      • Korea Research Institute of Standards and Science
    • Dong-Wook Kim

      • Chungnam National University
    • Jung Hyung Kim

      • Korea Research Institute of Standards and Science
    • Hyo-Chang Lee

      • Korea Aerospace University

    View abstract →