Plasma Etching
FOCUS · NW2 ·
Presentations
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Layer by layer etching of LaAlSiO$_{\mathrm{x}}$
COFFEE_KLATCH · Invited
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Authors
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Hisataka Hayashi
- Toshiba corporation
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Variation in photon-induced interface defects due to transient behavior of pulse modulated inductively coupled plasma
ORAL
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Authors
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Y. Miyoshi
- Sony Semiconductor Solutions Corp.
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M. Fukasawa
- Sony Semiconductor Solutions Corp.
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K. Nagahata
- Sony Semiconductor Solutions Corp.
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T. Tatsumi
- Sony Semiconductor Solutions Corp.
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Z. Liu
- Nagoya Univ.
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Y. Zhang
- Nagoya Univ.
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A. Ando
- Nagoya Univ.
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K. Takeda
- Nagoya Univ.
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K. Ishikawa
- Nagoya Univ.
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M. Sekine
- Nagoya Univ.
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M. Hori
- Nagoya Univ.
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Computer modelling of cryogenic etching in SF6/O2/SiF4 and CxFy inductively coupled plasmas
ORAL
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Authors
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Quan-Zhi Zhang
- University of Antwerp
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Annemie Bogaerts
- Antwerp University
- University of Antwerp, Plasmant
- Plasmant, University of Antwerp
- University of Antwerp
- Department of Chemistry, Research group PLASMANT, University of Antwerp
- PLASMANT University of Antwerp
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Temporal evolution of as-developed line and space photoresist profiles during etch.
ORAL
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Authors
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Barton Lane
- Tokyo Electron America
- Tokyo Electron Ltd.
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Peter Ventzek
- Tokyo Electron America
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Alok Ranjan
- TEL Technology Center, America, LLC
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Vinayak Rastogi
- TEL Technology Center, America, LLC
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Jun Yoshikawa
- Tokyo Electron Miyagi, LLC
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Origin of plasma-induced surface roughening and ripple formation during plasma etching
ORAL
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Authors
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Kouichi Ono
- Kyoto University
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Nobuya Nakazaki
- Kyoto University
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Hirotaka Tsuda
- Kyoto University
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Yoshinori Takao
- Yokohama National University
- Kyoto University
- Yokohama National Univ
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Koji Eriguchi
- Kyoto University
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Tailored Voltage Waveforms in an SF6/O2 discharge: slope asymmetry and its effect on surface nanotexturing of silicon
ORAL
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Authors
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G. Fischer
- Institut Photovoltaique d'Ile-de-France
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E. Drahi
- Total MS-Energie Nouvelles
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G. Poulain
- Total MS-Energie Nouvelles
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B. Bruneau
- LPICM, CNRS, Ecole Polytechnique, Universite Paris-Saclay
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E. V. Johnson
- LPICM, CNRS, École Polytechnique, Université Paris Saclay
- LPICM, CNRS, Ecole Polytechnique, Universite Paris-Saclay
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WITHDRAWN ABSTRACT
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