Secondary electron emission in the limit of low incident electron energies

A detailed review of experimental and theoretical studies of secondary electron emission (SEE) at low incident electron energies has been recently given in paper$^{\mathrm{1}}$. In particularly, discussion of some authors' statement$^{\mathrm{2,3}}$ on increase of the SEE yield up to unity if the primary electron energy tends to zero was reviewed. Present paper considers a technique for measurements of SEE yield near a sample surface$^{\mathrm{4}}$ making use of a magnetic field parallel to the surface. Using this technique it was shown that the SEE yield can approach unity for a polycrystalline, but not for a monocrystalline sample. This result was explained by additional reflection of primary electrons from a potential barrier near the sample surface. Therefore for suppression of the deleterious effects of SEE, e.g, for better performance of accelerators, it is important to monitor and control micro electric-fields arising near a polycrystalline surface. [1] A.N. Andronov. St. Petersburg State Polytechnic. Univ. J. Phys. and Math. Sc. V. 1. P. 67. 2014. [2] R.Cimino et.al., Proceedings of IPAC Dresden, Germany.2014. [3] J. Cazaux, J. Appl. Phys$.$ V.111, Ð. 064903. 2012. [4] A. Mustafaev, I. Kaganovich, et.al. Bull. of the APS. V. 60. No 9. Ð. 40. 2015.