Plasma Etching II
FOCUS · TF2 ·
Presentations
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Cryogenic Etching for Sub-10 nm Patterning for Bit Patterned Media Fabrication
COFFEE_KLATCH · Invited
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Authors
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Deirdre Olynick
- Lawrence Berkeley National Laboratory
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Atomic Layer Etch to Escape Aspect Ratio Dependent Etching-Profile-Selectivity Trade-offs in Plasma Etch
ORAL
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Authors
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Alok Ranjan
- TEL Technology Center, America, LLC
- TEL Technology Center, America, LLC.
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Mingmei Wang
- TEL Technology Center, America, LLC
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Sonam Sherpa
- TEL Technology Center, America, LLC
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Peter Ventzek
- Tokyo Electron America, Inc.
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Low Damage Etching with Atomic Layer Precision
ORAL
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Authors
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L. Dorf
- Applied Materials
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Shahid Rauf
- Applied Materials
- Applied Materials, Sunnyvale, CA
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G. Monroy
- Applied Materials
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K. Ramaswamy
- Applied Materials
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K. Collins
- Applied Materials
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Y. Zhang
- Applied Materials
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Layer by layer etching of LaAlSiOx
ORAL
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Authors
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Mitsuhiro Omura
- Toshiba Corporation
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Kazuhito Furumoto
- Toshiba Corporation
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Kazuhisa Matsuda
- Toshiba Corporation
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Toshiyuki Sasaki
- Toshiba Corporation
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Itsuko Sakai
- Toshiba Corporation
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Hisataka Hayashi
- Toshiba Corporation
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Cryogenic etching of Si with SF$_{6}$/O$_{2}$: a modeling and experimental study
ORAL
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Authors
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Stefan Tinck
- University of Antwerp
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Erik C. Neyts
- University of Antwerp
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Thomas Tillocher
- University of Orleans
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Remi Dussart
- University of Orleans
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Annemie Bogaerts
- University of Antwerp
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Etching of GaAs materials by chlorine neutral beam for quantum nanodisks fabrication
ORAL
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Authors
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Cedric Thomas
- Tohoku University
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Akio Higo
- Tohoku University
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Takeru Okada
- Tohoku University
- Institute of Fluid Science, Tohoku University
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Seiji Samukawa
- Tohoku University
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Etching of Magnetic Tunneling Junctions Materials using a Reactive Ion Beam
ORAL
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Authors
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Kyung Chae Yang
- SungKyunKwan University
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Sung Woo Park
- SungKyunKwan University
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Min Hwan Jeon
- SungKyunKwan University
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Geun Young Yeom
- SungKyunKwan University
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Dry Etching of Si$_{3}$N$_{4}$, SiO$_{2}$ and Si Using Remote Plasma Sources Sustained in NF$_{3}$ Mixtures
ORAL
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Authors
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Shuo Huang
- U. Michigan
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Vladimir Volynets
- Samsung Electronics Ltd.
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Sangheon Lee
- Samsung Electronics Ltd.
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In-Cheol Song
- Samsung Electronics Ltd.
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Siqing Lu
- Samsung Electronics Ltd.
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James Hamilton
- U. College London
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Jonathan Tennyson
- U. College London
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Mark J. Kushner
- University of Michigan
- U. Michigan
- University of Michigan EECE
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