Atomic and Molecular Scattering Data for Plasma and Related Applications Workshop II
INVITED · MW1 ·
Presentations
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Atomic Data Quality and Needs for Collisional-Radiative Modeling
COFFEE_KLATCH · Invited
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Authors
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Yuri Ralchenko
- National Institute of Standards and Technology
- NIST
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Charge exchange spectroscopy of multiply charged ions for the development of the EUV light source for the next generation photo lithography
COFFEE_KLATCH · Invited
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Authors
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Hajime Tanuma
- Department of Physics, Tokyo Metropolitan University
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Interactions of Deuterium Plasma with Lithiated and Boronized Surfaces in NSTX-U
COFFEE_KLATCH · Invited
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Authors
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Predrag Krstic
- State University of New York - Stony Brook
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