Advanced RF Systems for Plasma Control
FOCUS · AM1 ·
Presentations
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Introduction
COFFEE_KLATCH
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Authors
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David Coumou
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Time-Modulated Inductively Coupled Plasmas for Advanced Dry Etching Processes
Invited
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Authors
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Waheb Bishara Samer Banna
- Applied Materials Inc.
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The Electrical Asymmetry Effect in capacitive RF plasmas: Past, Present, and Future
Invited
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Authors
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J. Schulze, A. Derzsi, I. Korolov, S. Brandt, Z. Donko
- West Virginia University ; Hungarian Academy of Sciences
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Break
COFFEE_KLATCH
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Control of Ion Energy Distributions Through the Phase Difference Between Multiple Frequencies in Capacitively
Invited
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Authors
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Yiting Zhang Mark J. Kushner
- University of Michigan
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EEDf, IEDf and some of the physics of the Non-ambipolar Electron Plasma (NEP)
Invited
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Authors
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Lee Chen Zhiying Chen
- Tokyo Electron America, Inc.
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Lunch
COFFEE_KLATCH
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Centralized and Coherent Feedforward Impedance Tuning Control and Feedback Power Regulation for the Enhancement of RF Plasma Processing Systems
Invited
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Authors
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David Coumou
- ENI Products, MKS Instruments, Inc
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Inductively Coupled Plasma Sources for Dry Etching and Annealing Processes
Invited
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Authors
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Tomohiro Okumura
- Panasonic
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Panel Discussion
Invited
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