Performance evaluation of novel square-bordered position-sensitive silicon detectors with four-corner readout

ORAL

Abstract

A new square-bordered type two-dimensional position sensitive silicon detector produced by Micron Semiconductor Ltd. was recently developed in collaboration with Cyclotron Institute at Texas A{\&}M University. It consists of a square-shaped ion-implanted resistive anode framed by an additional square low resistivity strip. The main characteristics of the detectors are given and $\alpha $-particle as well as in-beam measurements concerning detector operational parameters such as response to position linearity, position and energy resolutions are presented. Experimental results obtained in beam show a position resolution below 1 mm (FWHM) and a very good non-linearity of less than 1 {\%} (rms).

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Authors

  • A. Banu

    • Cyclotron Institute,Texas A\&M University, College Station, TX 77843

  • Y. Li

    • Cyclotron Institute,Texas A\&M University, College Station, TX 77843

  • M. McCleskey

    • Cyclotron Institute,Texas A\&M University, College Station, TX 77843

  • C.A. Gagliardi

    • Cyclotron Institute,Texas A\&M University, College Station, TX 77843

  • L. Trache

    • Cyclotron Institute,Texas A\&M University, College Station, TX 77843

  • R.E. Tribble

    • Cyclotron Institute,Texas A\&M University, College Station, TX 77843

  • M. Bullough

    • Micron Semiconductor Ltd., 1 Royal Buildings, Marlborough Road, Lancing Business Park, Lancing, Sussex, BN15 8SJ, UK

  • S. Walsh

    • Micron Semiconductor Ltd., 1 Royal Buildings, Marlborough Road, Lancing Business Park, Lancing, Sussex, BN15 8SJ, UK

  • C. Wilburn

    • Micron Semiconductor Ltd., 1 Royal Buildings, Marlborough Road, Lancing Business Park, Lancing, Sussex, BN15 8SJ, UK