Towards fast error syndrome measurements in dual species atomic qubit arrays

Fault tolerant operation of neutral atom quantum computers requires fast error detection and correction. The effective speed of fluorescence based state detection of atomic arrays is limited by photon scattering rates and long image transfer times from EMCCD sensors. We propose an approach to decrease overall measurement time in atomic qubit arrays by amplifying the fluorescence signal and reducing the image transfer time. Our architecture relies on a dual species array of individual rubidium and cesium atoms imaged by a Single Photon Avalanche Diode (SPAD) array sensor. By selecting Rydberg states with resonant atomic interactions, our scheme entangles a single cesium ancilla qubit with several rubidium measurement qubits, thereby mapping a single atom state into a multi-atom repetition code representation. Using N measurement atoms, an N fold increase in scattering rate enables fast, high fidelity, and crosstalk-free mid-circuit measurements. The SPAD array allows for decreased image acquisition time compared to traditional sensor technologies. Combined, we predict that syndrome measurement cycle rates reaching 50 kHz are feasible.