Identification of highly charged Zr and Mo EUV spectral lines in an electron beam ion trap

POSTER

Abstract

Extreme ultraviolet (EUV) spectra of highly charged Zr and Mo ions produced and

confined in the electron beam ion trap (EBIT) at the National Institute of Standards

and Technology were measured [1]. The EUV emissions were recorded with a flat-

field grazing-incidence extreme-ultraviolet spectrometer [2] in the wavelength

range of 2 nm to 20 nm. The electron beam energy was systematically varied

between 2.5 keV and 11.8 keV to selectively create different ionization stages. Line

identification was aided by a detailed collisional-radiative modelling code NOMAD

that simulated the non-Maxwellian EBIT plasma. Many new lines from Li-like to

Ne-like ions were identified that arise from dominant electric as well as magnetic-

dipole transitions.

[1] J. D. Gillaspy, Phys. Scr. T 71, 99 (1997).

[2] Blagojević et al., Rev. Sci. Instrum. 76, 083102 (2005).

*NIST award #70NANB23H123 and NSF award 2309274

Presenters

  • David Salgado

    • Appalachian State University

Authors

  • David Salgado

    • Appalachian State University
  • Jessica Gerac

    • Appalachian State University
  • Leiyla S Brent

    • Loyola University Maryland
  • Hunter W Staiger

    • Clemson University
  • Yuri Ralchenko

    • National Institute of Standards and Technology
  • Endre Takacs

    • Clemson University
  • Roshani Silwal

    • Appalachian State University