A long chain trapped-ion systems with in situ mid-circuit measurement

Trapped-ion system is a promising platform for quantum information processing (QIP). Previous research has demonstrated QIP of long-range spin physics with a long chain of ions (~50), however performing in-situ mid-circuit measurement was previously challenging for the field. Here we show the developments of our segmented blade trapped-ion system for a long ion chain. To achieve low neighbouring crosstalk while performing in-situ mid-circuit measurements, we will implement two, NA=0.5 imaging systems with photon time-tagged detection, paired with an aberration corrected addressing beam. Careful optical engineering and custom home-made compact optics breadboards will provide long term stability of our system. Through optimized vacuum engineering and extensive outgassing tests, low background collision rates will be achieved by reaching vacuum pressures that are projected to be an order of magnitude lower than current room-temperature trapped-ion QIP devices. This device will allow us to perform a wide range of QIP experiments, like measurement-based quantum simulations of spin Hamiltonian’s and hybrid digital-analog quantum algorithms.