high-resolution x-ray stimulated Raman spectroscopy using stochastic pulses

POSTER

Abstract

The X-ray free-electron lasers (XFELs) generate high-intensity x-ray pulses, which enable x-ray nonlinear spectroscopies. The extension of nonlinear spectroscopies to the x-ray domain promises the observation of electronic dynamics in their natural timescale with atomic spatial resolution. Stimulated x-ray Raman spectroscopy is an especially powerful tool, which works in a propagation mode and combines large signal enhancement through stimulated emission with ultrahigh energy resolution that overcomes the core-hole lifetime broadening. We present high-resolution stimulated Raman spectroscopy realized using stochastic XFEL pulses and correlation techniques. A covariance map between the transmitted incident SASE pulse and the stimulated Raman scattering produces a high-resolution x-ray Raman spectrum. This promising tool could be applied to study ultrafast electronic and molecular dynamics such as charge transfer in complex systems.

Presenters

  • kai li

    • University of Chicago

Authors

  • kai li

    • University of Chicago
  • Linda Young

    • Argonne Nat'l Lab
    • Argonne National Laboratory
  • Alexander Magunia

    • Heidelberg University
  • Christian Ott

    • Max-Planck-Institut für Kernphysik
  • Gilles Doumy

    • Argonne National Laboratory
  • Thomas Pfeifer

    • Max-Planck-Inst Kernphys
    • Max-Planck-Institut für Kernphysik
    • Max Planck Inst Kernphys
  • Rubensson Jan-Erik

    • uppsala university
  • Michael Meyer

    • EuXFEL
    • European XFEL
  • Tommaso Mazza

    • EuXFEL
    • European XFEL
  • Marc Rebholz

    • uppsala university