New Methods and Applications in Precision Measurements

ORAL · Z09 · ID: 439147





Presentations

  • ORAL

    Publication: PHYSICAL REVIEW A 104, 032824 (2021)

    Presenters

    • Samuel Berweger

      • National Institute of Standards and Technology
      • National Institute of Standards and Tech

    Authors

    • Samuel Berweger

      • National Institute of Standards and Technology
      • National Institute of Standards and Tech
    • Alexandra B Artusio-Glimpse

      • National Institute of Standards and Technology
    • Nikunjkumar Prajapati

      • National Institute of Standards and Technology
    • Eric Imhof

      • Northrop Grumman Corporation
    • Steven R Jefferts

      • Northrup Grumman Corporation
    • Robert Wyllie

      • Georgia Institute of Technology
      • Georgia Tech Research Institute
    • Brian C Sawyer

      • Georgia Institute of Technology
      • Georgia Tech Research Institute
    • Thad G Walker

      • Wisconsin
      • University of Wisconsin - Madison
      • University of Wisconsin-Madison
    • Christopher L Holloway

      • National Institute of Standards and Technology Boulder
      • National Institute of Standards and Technology
    • Matthew T Simons

      • National Institute of Standards and Technology Boulder
      • National Institute of Standards and Technology

    View abstract →

  • ORAL

    Publication: https://doi.org/10.1063/5.0069195

    Presenters

    • Nikunjkumar Prajapati

      • National Institute of Standards and Technology

    Authors

    • Nikunjkumar Prajapati

      • National Institute of Standards and Technology
    • Samuel Berweger

      • National Institute of Standards and Technology
      • National Institute of Standards and Tech
    • Alexandra B Artusio-Glimpse

      • National Institute of Standards and Technology
    • Andrew P Rotunno

      • National Institute of Standards and Technology
    • Yoshiaki Kasahara

      • The University of Texas at Austin
    • Andrea Alu

      • The Graduate Center, City University of New York
    • Richard W Ziolkowski

      • University of Arizona
    • Matthew T Simons

      • National Institute of Standards and Technology Boulder
      • National Institute of Standards and Technology
    • Christopher L Holloway

      • National Institute of Standards and Technology Boulder
      • National Institute of Standards and Technology

    View abstract →

  • ORAL

    Publication: Technique for Rapid Mass Determination of Airborne Microparticles Based on Release and Recapture from an Optical Dipole Force Trap, G. Carlse, K. B. Borsos, H. C. Beica, T. Vacheresse, A. Pouliot, J. Perez-Garcia, A. Vorozcovs, B. Barron, S. Jackson, L. Marmet and A. Kumarakrishnan, Physical Review Applied 14, 024017 (2020).

    Presenters

    • Gehrig M Carlse

      • York University

    Authors

    • Gehrig M Carlse

      • York University
    • Kevin B Borsos

      • York University
    • Hermina C Beica

      • York University
    • Thomas Vaccheresse

      • York University
    • Alexander Pouliot

      • York University
    • Jorge Perez-Garcia

      • York University
    • Andrew Vorozcovs

      • York University
    • Boris Barron

      • York University
      • Cornell University
    • Shira Jackson

      • York University
    • Louis Marmet

      • York University
    • A Kumarakrishnan

      • York University

    View abstract →

  • ORAL

    Presenters

    • Donald P Fahey

      • DEVCOM Army Research Laboratory
      • US Army Research Lab Adelphi

    Authors

    • Donald P Fahey

      • DEVCOM Army Research Laboratory
      • US Army Research Lab Adelphi
    • Kurt Jacobs

      • DEVCOM Army Research Laboratory
    • Matthew J Turner

      • Quantum Technology Center, University of Maryland
      • University of Maryland
      • University of Maryland, College Park
    • Hyeongrak Choi

      • Massachusetts Institute of Technology
    • Dirk Englund

      • Massachusetts Institute of Technology
      • Columbia Univ
    • Matthew Trusheim

      • DEVCOM Army Research Laboratory

    View abstract →

  • ORAL

    Publication: Atom trap trace analysis of Ca-41 samples at 1E-16 abundance level

    Presenters

    • Wei-Wei Sun

      • University of Science and Technology of China

    Authors

    • Wei-Wei Sun

      • University of Science and Technology of China
    • Tong-Yan Xia

      • University of Science and Technology of China
    • Hui-Min Zhu

      • University of Science and Technology of China
    • Wei jiang

      • University of Science and Technology of China
      • University of Science and Technology of China, Hefei, China
    • Tian Xia

      • University of Science and Technology of
      • University of Science and Technology of China
    • Zheng-Tian Lu

      • University of Science and Technology of China
      • University of Science and Technology of China, Hefei, China

    View abstract →

  • ORAL

    Presenters

    • yanqing Chu

      • University of Science and Technology of China, Hefei, China

    Authors

    • yanqing Chu

      • University of Science and Technology of China, Hefei, China
    • Amin Tong

      • University of Science and Technology of China, Hefei, China
    • Jiqiang Gu

      • University of Science and Technology of China, Hefei, China
    • Xize Dong

      • University of Science and Technology of China
      • University of Science and Technology of China, Hefei, China
    • Shuiming Hu

      • University of Science and Technology of China, Hefei, China
    • Weikang Hu

      • University of Science and Technology of China, Hefei, China
    • Zehua Jia

      • Institute of Modern Physics, Chinese Academy of Sciences, Lanzhou 730000, China; School of Nuclear Science and Technology, Lanzhou University, Lanzhou 730000, China
    • Wei jiang

      • University of Science and Technology of China
      • University of Science and Technology of China, Hefei, China
    • Zheng-Tian Lu

      • University of Science and Technology of China
      • University of Science and Technology of China, Hefei, China
    • Florian Ritterbusch

      • University of Science and Technology of China
      • University of Science and Technology of China, Hefei, China
    • Liangting Sun

      • Institute of Modern Physics, Chinese Academy of Sciences, Lanzhou 730000, China; School of Nuclear Science and Technology, Lanzhou University, Lanzhou 730000, China
    • Zhaofeng Wan

      • University of Science and Technology of China, Hefei, China
    • Guoming Yang

      • University of Science and Technology of China, Hefei, China

    View abstract →

  • ORAL

    Presenters

    • Xize Dong

      • University of Science and Technology of China
      • University of Science and Technology of China, Hefei, China

    Authors

    • Xize Dong

      • University of Science and Technology of China
      • University of Science and Technology of China, Hefei, China
    • Zheng-Tian Lu

      • University of Science and Technology of China
      • University of Science and Technology of China, Hefei, China
    • Wei jiang

      • University of Science and Technology of China
      • University of Science and Technology of China, Hefei, China
    • Florian Ritterbusch

      • University of Science and Technology of China
      • University of Science and Technology of China, Hefei, China
    • Xing-An Wang

      • University of Science and Technology of China
    • Dao-Fu Yuan

      • University of Science and Technology of China
    • Jie S Wang

      • University of Science and Technology of China
    • Jing-Wen Yan

      • University of Science and Technology of China
    • Guo-Min Yang

      • University of Science and Technology of China
    • Wen-Tao Chen

      • University of Science and Technology of China

    View abstract →

  • ORAL

    Publication: J. S. Wang, F. Ritterbusch, X.-Z. Dong, C. Gao, H. Li, W. Jiang, S.-Y. Liu, Z.-T. Lu, W.-H. Wang, G.-M. Yang, Y.-S. Zhang, Z.-Y. Zhang, Optical excitation and trapping of Kr81, Phys. Rev. Lett. 127, 023021 (2021).

    Presenters

    • Jie S Wang

      • University of Science and Technology of China

    Authors

    • Jie S Wang

      • University of Science and Technology of China
    • Florian Ritterbusch

      • University of Science and Technology of China
      • University of Science and Technology of China, Hefei, China
    • Zheng-Tian Lu

      • University of Science and Technology of China
      • University of Science and Technology of China, Hefei, China
    • Wei jiang

      • University of Science and Technology of China
      • University of Science and Technology of China, Hefei, China
    • Guo-Min Yang

      • University of Science and Technology of China

    View abstract →