One- and two-qubit gate infidelities due to motional errors in trapped ions and electrons
ORAL
Abstract
In this work, we derive analytic formulae that determine the effect of error mechanisms in laser-free one- and two-qubit gates in trapped ions and electrons. First, we analyze, and derive expressions for, the effect of driving field inhomogeneities on one-qubit gate fidelities. Second, we derive expressions for two-qubit gate errors, including static motional frequency shifts, trap anharmonicities, field inhomogeneities, heating, and motional dephasing. We show that, for small errors, each of our expressions for infidelity converges to its respective numerical simulation; this shows that our formulae are sufficient for determining error budgets for high-fidelity gates, obviating numerical simulations in future projects. All of the derivations are general to any internal qubit state, and any \textit{mixed} state of the ion crystal's motion. Finally, we note that, while this manuscript focuses on laser-free systems, static motional frequency shifts, trap anharmonicities, heating, and motional dephasing are also important error mechanisms in laser-based gates, and our expressions apply.
*R.T.S., Q.Y. and K.M.B. acknowledge support from the Lawrence Livermore National Laboratory (LLNL) Laboratory Directed Research and Development (LDRD) program under Grant No. 21-FS-008. Q.Y. and H.H. acknowledge support from AFOSR through grant FA9550-20-1-0162, the NSF QLCI program through grant number OMA-2016245. K.M.B's contributions to this work were performed under the auspices of the U. S. Department of Energy by Lawrence Livermore National Laboratory under Contract No. DE-AC52-07NA27344.
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Publication: arXiv:2111.01913
Presenters
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Robert T Sutherland
- University of Texas at San Antonio
- University of Texas at San Antonio, San Antonio, Texas 78249, USA
- Lawrence Livermore Natl Lab