X-ray spectroscopy of highly ionized atoms using Transition Edge Sensor (TES) microcalorimeters at the NIST EBIT

POSTER

Abstract

NIST has built a new broadband X-ray spectrometer from an array of 192 individual TES (Transition Edge Sensor) microcalorimeters, designed specifically for high resolution spectroscopy of X-ray transitions in highly ionized atoms, spanning a spectral range from a few hundred eV to 20 keV. Commissioned recently at the NIST EBIT (electron beam ion trap) facility, this time-resolved, photon-counting TES Spectrometer is dubbed the acronym ``NETS''. We present the earliest NETS observations of X-ray emissions from various ion species created in the NIST EBIT [1], which serve to illustrate its capabilities. Ongoing studies enabled by NETS, including tests of atomic theory and other potential applications, are also presented at this conference.~ [1] P. Szypryt, \textit{et al}., Rev. Sci. Instrum. \textbf{90}, 123107 (2019)

Authors

  • Joseph Tan

    • National Institute of Standards and Technology (NIST)

  • P. Szypryt

    • NIST

  • G.C. O'Neil

    • NIST

  • E. Takacs

    • Clemson University

  • S.W. Buechele

    • Clemson University

  • A.S. Naing

    • University of Delaware

  • D. A. Bennet

    • NIST

  • W.B. Doriese

    • NIST

  • M. Durkin

    • NIST

  • J.W. Fowler

    • NIST

  • J.D. Gard

    • University of Colorado

  • G.C. Hilton

    • NIST

  • K.M. Morgan

    • NIST

  • C.D. Reintsema

    • NIST

  • D.R. Schmidt

    • NIST

  • D.S. Swetz

    • NIST

  • J.N. Ullom

    • NIST

  • Yu. Ralchenko

    • NIST