Measuring sub-femtosecond x-ray pulses with angular streaking
POSTER
Abstract
The recent development of sub-femtosecond x-ray pulses from free-electron lasers has called for a high resolution measurement scheme to characterize such short pulses and the electronic dynamics they induce. The angular streaking technique exploits the phase-dependent momentum shift experienced by the photoelectrons ionized by x-ray pulses in the presence of a circularly polarized streaking laser field. We present a method to extract the temporal and spectral profiles of an electronic wavepacket produced by x-ray ionization from the photoelectron momentum distribution. We use this method to demonstrate the attosecond operation of a soft x-ray FEL, and study attosecond electron dynamics in x-ray photoionization.
*This work was supported by US Department of Energy (DOE), Office of Science, Basic Energy Sciences (BES), Chemical Sciences, Geosciences, and Biosciences Division; DOE, Office of Science, BES (DE-AC02-76SF00515); DOE, Office of Science, BES, Scientific User Facilities, Accelerator and Detector Research Division Field Work Proposal (100317); National Science Foundation Grant (PHY-1535215).