Electron-impact excitation of xenon

Xenon electron-impact cross sections are used in the analysis of non-invasive optical emission spectroscopy diagnostics of many xenon plasmas including Hall thrusters. We present measurements of optical emission cross sections as a function of incident electron energy (0-200 eV) for a large number of emission lines in the 250-900 nm wavelength range using a mono-energetic electron beam along with monchromator/PMT detector. The selection of measured cross sections include both excitation into higher neutral levels, and simultaneous ionization/excitation into Xe$^+$, Xe$^{2+}$, and Xe$^{3+}$ levels. Measurements were performed at a low pressure to minimize pressure effects often observed in xenon measurements due to radiation trapping of resonant emission lines [1].\\[4pt] [1] J. T. Fons and C. C. Lin, Phys. Rev. A \textbf{58}, 4603 (1998).